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	Adaptive Feedback Convolutional-Neural-Network-Based High-Resolution Reflection-Waveform Inversion 期刊论文 OAI收割 JOURNAL OF GEOPHYSICAL RESEARCH-SOLID EARTH, 2022, 卷号: 127, 期号: 6, 页码: 23 作者: Wu, Yulang; McMechan, George A.; Wang, Yanfei \| 收藏 \| 浏览/下载：50/0 \| 提交时间：2022/07/18 machine learning deep learning convolutional neural network reflection full-waveform inversion k-means clustering
	Reflection waveform inversion with variable density 期刊论文 OAI收割 JOURNAL OF APPLIED GEOPHYSICS, 2019, 卷号: 170, 页码: 16 作者: He, Bin; Liu, Yike; Lu, Huiyi; Shi, Haoxian; Yi, Jia \| 收藏 \| 浏览/下载：82/0 \| 提交时间：2020/05/19 Reflection waveform inversion Cycle-skipping Full waveform inversion Density
	Reflection seismic waveform tomography of physical modelling data 期刊论文 OAI收割 JOURNAL OF GEOPHYSICS AND ENGINEERING, 2016, 卷号: 13, 期号: 2, 页码: 146-151 作者: Rao, Y.; Wang, Y.; Zhang, Z. D.; Ning, Y. C.; Chen, X. H. \| 收藏 \| 浏览/下载：26/0 \| 提交时间：2017/11/22 waveform tomography perfectly matched layer reflection seismic full waveform inversion layer striping scheme
	Probing the Moho interface using SsPmp waves 期刊论文 OAI收割 CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2015, 卷号: 58, 期号: 10, 页码: 3571-3582 作者: Liu Zhen; Tian Xiao-Bo; Zhu Gao-Hua; Liang Xiao-Feng; Duan Yao-Hui \| 收藏 \| 浏览/下载：26/0 \| 提交时间：2017/11/27 Virtual Deep Seismic Sounding Full Reflection Crustal Thickness Moho Pn Velocity
	Frequency multiscale full-waveform velocity inversion 期刊论文 OAI收割 CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2015, 卷号: 58, 期号: 1, 页码: 216-228 作者: Zhang WenSheng; Luo Jia; Teng JiWen \| 收藏 \| 浏览/下载：32/0 \| 提交时间：2021/01/14 ABSORBING BOUNDARY-CONDITIONS SEISMIC-REFLECTION DATA FINITE-FREQUENCY DIFFRACTION TOMOGRAPHY ELASTIC INVERSION NEWTON METHODS GAUSS-NEWTON DOMAIN MEDIA MINIMIZATION Acoustic wave equation Frequency multiscale Time domain Full-waveform inversion Velocity BFGS Marmousi model Finite-difference method MPI parallel
	The full hemisphere integrating measurement of the reflectance of black cavity (EI CONFERENCE) 会议论文 OAI收割 ICO20: Illumination, Radiation, and Color Technologies, August 21, 2005 - August 26, 2005, Changchun, China 作者: Wang Y.; Yu B.; Wang Y.; Wang Y.; Wang Y. 收藏 \| 浏览/下载：18/0 \| 提交时间：2013/03/25 The conical black cavities are used in the Solar Irradiance Absolute Radiometers (SIARs) of the solar constant monitor aboard on the SZ spaceship and of the Solar Total Irradiance Monitor (STIM) aboard on sun-synchronous polar orbit weather satellites. A low reflectance measurement instrument which is used for making the integrating measurement on the reflectance of the conical black cavity in a high precision within the full hemisphere (include the entrance of the Ulbrichtsphere) has been constructed. The characteristic of the instrument is the employment of a semi-transparent mirror which is mounted in an inclination angle of 45 degrees in front of the entrance of the Ulbrichtsphere. The incident beam is reflected to the black cavity or white board by the semi-transparent mirror. A portion of those which is made diffused reflection through the black cavity or white board is measured by the detector located in the side face of the Ulbrichtsphere and the other portion which is reflected to the entrance is measured by the other detector after passing through the semi-transparent mirror and then being focused on by an ellipsoidal mirror. The two measurement data are added up to get the integrating reflectance within full hemisphere. The presentation and verification on the measurement result of the reflectance of the black cavity and its precision are described in this article. The absolute accuracy can reach 0.012%.
	Investigation of growth mode in ZnO thin films prepared at different temperature by plasma-molecular beam epitaxy (EI CONFERENCE) 会议论文 OAI收割 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004, 13th International Conference on Molecular Beam Epitaxy, August 22, 2004 - August 27, 2004 Liang H. W.; Lu Y. M.; Shen D. Z.; Yan J. F.; Li B. H.; Zhang J. Y.; Liu Y. C.; Fan X. W. 收藏 \| 浏览/下载：37/0 \| 提交时间：2013/03/25 High-quality ZnO thin films on c-plane sapphire (Al2O 3) substrates were prepared by plasma-molecular beam epitaxy (P-MBE). The influence of growth temperature on growth mode of ZnO was investigated. Real-time monitored by reflection high-energy electron diffraction (RHEED) images show that below 500 C ZnO thin film was grown by three-dimension (3D) growth mode. While the two-dimension (2D) growth mode was obtained above growth temperature of 650 C. Atomic force microscopy (AFM) images present that the surface morphology of ZnO thin film with 2D growth is improved and X-ray rocking curves (XRC) indicate that the full width at half maximum (FWHM) of the ZnO (0 0 2) peak becomes narrow. From the photoluminescence (PL) spectra ultraviolet (UV) emission peak exhibits obvious blue-shift for the samples grown at lower temperature which is attributed to the effect of the quantum confinement arisen from small crystal grain sizes. The minimum carrier concentration of N=7.661016 cm-3 was obtained in the ZnO thin films with the 2D grown which is closed to that of bulk ZnO. 2005 Elsevier B.V. All rights reserved.