机构

• 高能物理研究所 [2]
• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [3]

内容类型

• 期刊论文 [2]
• 会议论文 [1]

发表日期

• 2015 [1]
• 2009 [1]
• 2007 [1]

学科主题

• Physics [2]

筛选

浏览/检索结果: 共3条，第1-3条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Characterization on surface and interface structure of epitaxial Pr0.7Sr0.3MnO3/La0.5Ca0.5MnO3/Pr0.7Sr0.3MnO3 trilayer 期刊论文  OAI收割 SUPERLATTICES AND MICROSTRUCTURES, 2015, 卷号: 79, 页码: 108-115 作者:  Wang, HO;  Liu, H;  Cao, MX;  Tan, WS;  Wang, XX 收藏  |  浏览/下载：39/0  |  提交时间：2016/04/18 Grazing incidence x-ray reflectivity  Interface  Roughness  Strain  Pr0.7Sr0.3MnO3/La0.5Ca0.5MnO3/Pr0.7Sr0.3MnO3   1D-KBA microscope using double-periodic multilayer (EI CONFERENCE) 会议论文  OAI收割 Advances in X-Ray/EUV Optics and Components IV, August 3, 2009 - August 5, 2009, San Diego, CA, United states 作者:  Wang Z.;  Wang X.;  Wang X.;  Wang X.;  Wang Z. 收藏  |  浏览/下载：10/0  |  提交时间：2013/03/25 To study the action of shock wave in CH target  one-dimensional grazing incidence KBA microscope for 4.75keV energy was set up. Because of strong absorption in air  4.75keV energy microscope can just work in vacuum. Accordingly  the alignment and assemblage will be very complicated and difficult. A special multilayer method  using double periodic multilayer  was proposed to solve this problem. This multilayer has high reflectivity not only for 4.75keV X-rays but also for 8keV X-rays at the same grazing incidence angle. It means 1D-KBA microscope has the same light trace for different working energies. Therefore  we can implement the alignment and assembly of 4.75keV system by the help of 8keV X-rays. Because 8keV X-rays is very easy produced by X-ray tube and has strong transmittability in air  the alignment and assemblage process became relatively easy. By now  we have finished the alignment experiment at 8keV and obtained imaging results. The performance is about 2-3m resolution in 250m field of view. It is coincide with the calculation. 2009 SPIE.   Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity 期刊论文  OAI收割 ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 4, 页码: 2422-2427 作者:  Zhou, BQ;  Liu, FZ;  Zhu, MF;  Zhou, YQ;  Wu, ZH 收藏  |  浏览/下载：26/0  |  提交时间：2016/06/29 grazing incidence X-ray reflectivity  microcrystalline silicon film  surface roughness  growth mechanism