机构

• 长春光学精密机械与物... [6]
• 自动化研究所 [1]

采集方式

• OAI收割 [7]

内容类型

• 会议论文 [7]

发表日期

• 2015 [1]
• 2011 [2]
• 2009 [1]
• 2007 [2]
• 2006 [1]

学科主题

筛选

浏览/检索结果: 共7条，第1-7条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 eMood: Modeling Emotion for Social Media Analytics on Ebola Disease Outbreak 会议论文  OAI收割 the 2015 International Conference on Information Systems (ICIS 2015), Fort Worth, Texas, USA, 2015-12-13 ~ 2015-12-16 作者:  Chung, Wingyan;  He, Saike;  Zeng, Daniel 收藏  |   The application of template matching arithmetic on Strap-down North Seeking System (EI CONFERENCE) 会议论文  OAI收割 2011 International Conference on Mechatronic Science, Electric Engineering and Computer, MEC 2011, August 19, 2011 - August 22, 2011, Jilin, China Li D.-N.; Zhu W.; Chen T. 收藏  |   The research of the accurate measure of static transfer function for the TDI CCD camera (EI CONFERENCE) 会议论文  OAI收割 3rd International Photonics and OptoElectronics Meetings, POEM 2010, November 2, 2010 - November 5, 2010, Wuhan, China Guo-Ning L.; Long-Xu J.; Jian-Yue R.; Wen-Hua W.; Shuang-Li H. 收藏  |   Graph fitting test method for the interpolation error of Moire fringe (EI CONFERENCE) 会议论文  OAI收割 9th International Conference on Electronic Measurement and Instruments, ICEMI 2009, August 16, 2009 - August 19, 2009, Beijing, China 作者:  Sun Y.;  Sun Y. 收藏  |   Scaling and analyzing the influence of fluid surface of fluid with nano-granular through speckle pattern experiment (EI CONFERENCE) 会议论文  OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者:  Wang X.;  Wang Y.;  Wang Y.;  Wang Y. 收藏  |   Novel fast measurement method of twist angle and optical retardation of liquid crystal display (EI CONFERENCE) 会议论文  OAI收割 Asia Display 2007, AD'07, March 12, 2007 - March 16, 2007, Shanghai, China Huang X.; Lu Y.-T.; Kong X.-J.; Jing H.; Fu G.-Z.; Jin H. 收藏  |   The Simulation measurement experiment and calibration for Solar Total Irradiance Monitor on board (EI CONFERENCE) 会议论文  OAI收割 ICO20: Remote Sensing and Infrared Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China Yupeng W.; Wei F.; Bingxi Y. 收藏  |