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	Spectral analysis and line strength measurement method of near-infrared overlapped absorption lines 期刊论文 OAI收割 JOURNAL OF INFRARED AND MILLIMETER WAVES, 2018, 卷号: 37, 期号: 1, 页码: 106-111 作者: Jia Wei; He Ying; Zhang Yu-Jun; Liu Jian-Guo; Liu Wen-Qing \| 收藏 \| 浏览/下载：27/0 \| 提交时间：2019/06/03 laser absorption spectroscopy spectrum analysis wavelet denoising line profile fitting line strength
	Dislocation structure evolution and characterization in the compression deformed Mn-Cu alloy 期刊论文 OAI收割 Acta Materialia, 2007, 卷号: 55, 期号: 8, 页码: 2747-2756 Y. Zhong; F. Yin; T. Sakaguchi; K. Nagai; K. Yang 收藏 \| 浏览/下载：18/0 \| 提交时间：2012/04/13 Mn-Cu alloy X-ray diffraction electron backscatter diffraction dislocation stacking fault energy stacking-fault energy line-profile analysis shape-memory alloys x-ray-diffraction electron-microscopy fcc metals crystals contrast behavior polycrystals
	In Situ Synthesis Of Nanocrystalline Intermetallic Layer During Surface Plastic Deformation Of Zirconium 期刊论文 OAI收割 Surface & Coatings Technology, 2007, 页码: 583-589 作者: Jiang P(姜萍); Wei Q; Hong YS(洪友士); Lu J; Wu XL(武晓雷) 收藏 \| 浏览/下载：659/29 \| 提交时间：2009/08/03 Nanocrystalline Intermetallic Compound Plastic Deformation Diffusion Mechanical Attrition Treatment Line Profile Analysis Vacancy Concentration Triple Junctions Grain-Refinement Strain Alloy Diffusion Aluminum Transformation
	Key techniques of laser direct writing of fine lines on the spherical surface (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Design and Fabrication, August 21, 2005 - August 26, 2005, Changchun, China Liang F.; Hu J. 收藏 \| 浏览/下载：21/0 \| 提交时间：2013/03/25 The main principles of laser direct writing (LDW) system for lines on the spherical surface (SS) are discussed. It is pointed out that line profile is determined by the exposure dose distribution which lies on the light intensity distribution of focus plane and the scanning speed. To improve the quality of line profile on the SS several key techniques as follows are introduced. Firstly the unique system configuration four axes mutually intersecting at the center of the SS is adopted which ensures the shape of the focus be maintained circular during the writing period. Secondly an automatic focus system (AFS) with the function of automatic focus in a certain range is introduced. Thirdly to guarantee the linear velocity to accord with the exposure character of the photoresist all the time an efficient arithmetic that controls motors run at appropriate angular velocity in different latitude is developed. Finally to achieve a stable and well-behaved system so as to compensate the velocity instability resulting from unavoidable errors of mechanical and electronics factor a powerful programmable multi-axis controller (PMAC) is utilized as the kernel element of the servocontrol system and the curves of step response and parabolic response achieved by feedforward and PID loop tuning indicate that the location precision and velocity stability have reached a high level. The experimental results of LDW of lines on the SS work piece with a diameter 30 mm and a radius equal to 100 mm are given. The section analysis of the lines on the photoresist by the atomic force microscope (AFM) after exposure and development is performed. The results show that line width is about 3.0 m and the steep sides of the lines are parallel to each other.
	Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Zhou C.; Li H.; Chen C.; Zhou C.; Qian S. 收藏 \| 浏览/下载：36/0 \| 提交时间：2013/03/25 Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle optical system mechanical constructions DC serve motor control system array detector data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy low cost multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.