中国科学院机构知识库网格系统: 检索

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	The pull-in instability and eigenfrequency variations of a graphene resonator under electrostatic loading 期刊论文 OAI收割 MATHEMATICS AND MECHANICS OF SOLIDS, 2022, 页码: 18 作者: Zhang Y(张吟); Zhao YP(赵亚溥) \| 收藏 \| 浏览/下载：40/0 \| 提交时间：2022/08/10 Membrane vibration pull-in instability eigenfrequency electrostatic force large deflection nonlinearity
	Effects of mixed-liquor rheology on vibration of hollow-fiber membrane via particle image velocimetry and computational fluid dynamics 期刊论文 OAI收割 SEPARATION AND PURIFICATION TECHNOLOGY, 2020, 卷号: 239, 页码: 1-9 作者: Yu, Dawei; Liu, Mengmeng; Liu, Jibao; Zheng, Libing; Wei, Yuansong \| 收藏 \| 浏览/下载：20/0 \| 提交时间：2021/09/15 Vortex-induced vibration Hollow fiber membrane Mixed-liquor theology Specific flux Frequency Resonance
	Bifurcations of vortex-induced vibrations of a fixed membrane wing at Re 1000 期刊论文 OAI收割 NONLINEAR DYNAMICS, 2018, 卷号: 91, 期号: 4, 页码: 2097-2112 作者: Sun X; Wang SZ(王士召); Zhang JZ; Ye ZH \| 收藏 \| 浏览/下载：82/0 \| 提交时间：2018/10/30 Membrane wing Vortex-induced vibration Numerical simulation Bifurcation Fluid-structure interaction
	Micro-electro-mechanical systems capacitive ultrasonic transducer with a higher electromechanical coupling coefficient 期刊论文 OAI收割 Micro & Nano Letters, 2015, 卷号: 10, 期号: 10, 页码: 4 作者: Miao, J(苗静); Shen, WJ(沈文江); He, CD; Xue, CY; Xiong, JJ 收藏 \| 浏览/下载：88/0 \| 提交时间：2015/12/31 silicon elemental semiconductors silicon-on-insulator wafer bonding electromechanical effects ultrasonic transducers capacitive transducers micromechanical devices micromachining vibrations membranes finite element analysis reliability capacitance electromechanical coupling coefficient capacitive micromachined ultrasonic transducer impedance matching propagation medium microelectromechanical system capacitive ultrasonic transducer silicon on insulator wafer bonding optimum geometric dimensions membrane mechanical vibration electrical characteristics finite-element analysis operation mode device safety device reliability equivalent stress operation-collapse voltage bottom electrodes glass substrate surface parallel parasitic capacitance Si SiO2