中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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浏览/检索结果: 共12条,第1-10条 帮助

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空间引力波探测太极计划惯性传感器标度因数与质心偏差的在轨定标方案设计 期刊论文  OAI收割
ACTA PHYSICA SINICA, 2025, 卷号: 74, 期号: 8, 页码: 101-112
作者:  
刘畅;  魏晓通;  张昊越;  邓琼;  梁博
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Initial In-Flight Spectral Calibration of the Near-Infrared Spectra Acquired by the MarSCoDe Onboard the Zhurong Rover 期刊论文  OAI收割
REMOTE SENSING, 2022, 卷号: 14
作者:  
Wu, Bing;  Liu, Chengyu;  Xu, Rui;  Lin, Honglei;  Xu, Xuesen
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Initial In-Flight Spectral Calibration of the Near-Infrared Spectra Acquired by the MarSCoDe Onboard the Zhurong Rover 期刊论文  OAI收割
REMOTE SENSING, 2022, 卷号: 14, 期号: 9, 页码: 13
作者:  
Wu, Bing;  Liu, Chengyu;  Xu, Rui;  Lin, Honglei;  Xu, Xuesen
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Beam-based calibrations of the BPM offset at C-ADS Injector II 期刊论文  OAI收割
CHINESE PHYSICS C, 2016, 卷号: 40, 页码: 4
作者:  
Chen, Wei-Long;  Wang, Zhi-Jun;  Feng, Chi;  Dou, Wei-Ping;  Tao, Yue
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Beam-based calibrations of the bpm offset at c-ads injector ii 期刊论文  iSwitch采集
Chinese physics c, 2016, 卷号: 40, 期号: 7, 页码: 4
作者:  
Chen, Wei-Long;  Wang, Zhi-Jun;  Feng, Chi;  Dou, Wei-Ping;  Tao, Yue
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Modeling and analysis of dialyte-lens auto-focusing technology for theodolite (EI CONFERENCE) 会议论文  OAI收割
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, November 16, 2008 - November 19, 2008, Beijing, China
Wu L.-T.; Qiao Y.-F.; Wu D.-K.; Cai S.
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An automated method to calibrate industrial robot joint offset using virtual line-based single-point constraint approach 会议论文  OAI收割
St Louis, MO, USA, October 11-15, 2009
作者:  
Liu Y(刘永);  Zhang, George;  Li, Xiongzi;  Chen, Heping;  Zhang, Chi
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Development and sensitivity analysis of a portable calibration system for joint offset of industrial robot 会议论文  OAI收割
St Louis, MO, USA, October 11-15, 2009
作者:  
Liu Y(刘永);  Zhao, Jianguo;  Nieves-Rivera, Erick;  Jia, Yunyi;  Gao, Bingtuan
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Chip design of linear CCD drive pulse generator and control interface (EI CONFERENCE) 会议论文  OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Advanced Optical Manufacturing and Testing Technologies, November 2, 2005 - November 5, 2005, Xian, China
作者:  
Sun H.;  Wang Y.;  Wang Y.;  Wang Y.;  Wang Y.
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Study of removing striping noise in CCD image (EI CONFERENCE) 会议论文  OAI收割
ICO20: Optical Information Processing, August 21, 2005 - August 26, 2005, Changchun, China
作者:  
Liu H.;  Liu H.;  Liu H.
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