中国科学院机构知识库网格系统: 检索

End-to-end simulation for on-sky coupling to single-mode fibers of large optical telescopes 会议论文 OAI收割
Yokohama, Japan, 2024
作者: Zhou N(周楠); Hu ZW(胡中文)

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收藏 | 浏览/下载：1/0 | 提交时间：2025/12/28

Optical System Aberrations Optimizing Fiber Coupling Efficiency Error Budget

Mixed sensitivity H-infinity control of an adaptive optics system 期刊论文 OAI收割
Optical Engineering, 2016, 卷号: 55, 期号: 9, 页码: 094106
作者: Song, Dingan; Li, Xinyang; Peng, Zhenming

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收藏 | 浏览/下载：37/0 | 提交时间：2018/06/14

Aberrations Adaptive Optics Codes (Symbols) Control Controllers Optical Systems Robustness (Control Systems) Stability System Stability Uncertain Systems Wavefronts

Design and Simulation of Adaptive Optics controller Based on Mixed Sensitivity H-infinity control 期刊论文 OAI收割
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2016, 卷号: 9682, 页码: 96820H
作者: Song, Dingan; Li, Xinyang; Peng, Zhenming

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收藏 | 浏览/下载：38/0 | 提交时间：2018/06/14

Aberrations Adaptive Control Systems Codes (Symbols) Controllers Manufacture Mirrors Optical Testing Robustness (Control Systems) Stability System Stability Telescopes Uncertain Systems Wavefronts

Design and fabrication of imaging optical systems with freeform surfaces (EI CONFERENCE) 会议论文 OAI收割
Current Developments in Lens Design and Optical Engineering XIII, August 13, 2012 - August 15, 2012, San Diego, CA, United states
作者: Zhang F.; Wang L.; Wang L.; Wang L.; He X.

收藏 | 浏览/下载：44/0 | 提交时间：2013/03/25

Freeform surfaces provide more degrees of freedom for design of optical systems and enhance the ability of compensation and correction aberrations. Freeform surfaces are of advantage to balance the unsymmetrical aberrations especially for the wide-field off-axis optical systems. This paper focus on an off-axis reflective optical system which focal length is 550mm F# is 6.5 and field of view (FOV) is 76. The system adopts some freeform surfaces. We discuss the problems we noticed in processes of design manufacture measurement and alignment and the solutions. At last the periodical research result and the expected performance are given. 2012 SPIE.

Design of reimaging F/1.0 long-wavelength infrared optical system (EI CONFERENCE) 会议论文 OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, May 24, 2011 - May 24, 2011, Beijing, China
作者: Zhang X.; Zhang X.; Zhang X.

收藏 | 浏览/下载：54/0 | 提交时间：2013/03/25

A reimaging F/1.0 long-wavelength infrared optical system is proposed. The design has a flexible opto-mechanical layout. The design process is as follows. Firstly the catadioptric reimaging system consists of two reflecting mirrors and a relay lenses. Two reflecting mirrors make up of the first imaging system and are therefore free of chromatic aberrations while low dispersion lenses were used in the reimaging system so the optical system do not need achromatic design for a high image quality. Then to correct high-order aberrations resulting from large relative aperture more parameters need to be used with aspheric or diffractive surfaces due to modern optic technology development. Here aspheric is selected for easily manufacture. Finally the design is completed with the help of ZEMAX software. The effective focal length of the objective is 120mm and the field of view (FOV) is 4. The simulated final design shows adequate image quality and the modulation transfer function (MTF) is close to diffraction limit. The effect of the surrounding environmental temperature is analyzed using the concept of thermal defocusing and the thermal compensation is discussed. 2011 Copyright Society of Photo-Optical Instrumentation Engineers (SPIE).

Imaging system effects on the measuring accuracy of the optical surface in interferometer (EI CONFERENCE) 会议论文 OAI收割
3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011, Shanghai, China
Yang W.; Liu M.; Xu W.

收藏 | 浏览/下载：52/0 | 提交时间：2013/03/25

In order to measure high accuracy or mid spatial frequency optical surfaces this study investigated imaging system in Fizeau interferometer. Interferometer is a transferring phase information system. General transfer function can't evaluate the ability of imaging system in interferometer that transfers the phase information of the optical surface. So this paper deduced instrument transfer function (ITF) and used ITF to evaluate the phase information transfer ability of interferometer. We obtained some results about ITF of imaging system by numerical simulation when there are different aberrations in imaging system or measuring optical surfaces were different. Our results indicate that ITF can evaluate the ability of transferring phase information in interferometer and the distortion of imaging system evidently affects the accuracy of interferometric measurements. 2010 IEEE.

Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE) 会议论文 OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Yang P.; Ai H.

收藏 | 浏览/下载：46/0 | 提交时间：2013/03/25

Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity polarization phase plate primary aberrations STED pulse shape pulse duration and delay time. In this paper we found related models and simulate the relationship between the depletion patterns and the parameters and put forward effective approach to enhance the system resolution. 2010 SPIE.

Optical system of large relative aperture and wide field using aspheric corrector for detecting (EI CONFERENCE) 会议论文 OAI收割
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008, Chengdu, China
作者: Zhang J.; Zhang J.; Zhang J.; Wang J.

收藏 | 浏览/下载：37/0 | 提交时间：2013/03/25

The magnitude requirement of space target detecting determines that the image of detecting telescope should have several performances: small spots the wider field of view small 80% encircled energy diameter and good MTF(Modulation transfer function). So the aperture and field of view of optical system have some demands accordingly. The larger aperture the more extensive range which the telescope searches. Now most of ground telescopes whose apertures are from 500mm to 1000mm is on-axis optical system the more energy that telescope collects and higher magnitude the telescope detects so wide field of view becomes the most importance problem. To obtain large relative aperture and wide field of view the paper introduces a catadioptric telescope with small aperture aspheric refractive corrector whose conic surface will be used to remove the aberrations due to large relative aperture and wide field of view. As to the optical system there is only one aspheric refractive corrector and it is relatively easy for manufacturing because of its concave figure and normal material. The paper gives the example and optimizes this optical system with ZEMAX program. And then the paper provides a specific analysis program for testing the aspheric refractive corrector. The aperture of this optical system is 750mm and its relative aperture is 0.82 and the field of view is 3.6 diameter(diagonal). Its structure is simple and the image quality is also very good. 2009 SPIE.

Design and tolerance analysis of compensator for high order aspheric surface testing (EI CONFERENCE) 会议论文 OAI收割
2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China
作者: Chen X.; Liu W.; Chen X.; Chen X.

收藏 | 浏览/下载：44/0 | 提交时间：2013/03/25

High accuracy is required in surface testing of 90nm nodal point lithography projecting lens. By comparing various aspheric surface testing methods the structure layout of the compensator is a meniscus positive lens combined with a Plano-convex positive lens. The design results indicate that: primary and high order aberrations are balanced well we adopt Offner null compensator to test the aspheric surface in the point diffraction interferometer at last. In this paper MTF exceeds diffraction limit an Offner compensator is presented on the base of the third order aberration theory to test concave aspheric surface root-mean-square (RMS) of wave front error /167. The F-number of the system can achieve F/1.64. By the analysis of the process of aspheric surface testing with the designed system the optical construction parameters of which is determined by introducing equal-quantities spherical aberration to compensate all orders of aspheric coefficients. The field of view of the system is 0.02 a loosen distribution of the tolerance was presented based on the accuracy of measuring apparatus. 2009 SPIE.

The effect on tolerance distributing of an off-axis three mirror anastigmatic optical system with wavefront coding technology (EI CONFERENCE) 会议论文 OAI收割
Optical System Alignment and Tolerancing II, August 10, 2008 - August 11, 2008, San Diego, CA, United states
作者: Yan F.; Zhang X.-J.; Yan F.

收藏 | 浏览/下载：55/0 | 提交时间：2013/03/25

The wavefront coding technology is known as a system-level technology which can extend the depth of focus of optical system by innovative optical design and image restoration. This technology can control misfocus related aberrations including misfocus astigmatism and Petzval curvature temperature-related misfocus in digital imaging systems. It can also help optical system tolerate more residual error in optical manufacturing and alignment besides misfocus. The brief introduction of wavefront coding technology and the wavefront coded TMA system under research is presented respectively in part 1 and part 2. The "MTF similarity" is defined to describe the relationship among MTF at different position or different fields in the third part. It is also shown in this part that the MTF similarity of wavefront coded system is much higher than the normal system within a large range. In part 4 comparison between the origin system and the new system with wavefront coding technology is provided after multiple errors are introduced from which it can be observed that the system with wavefront coding technology can tolerate much bigger error than origin system. The error tolerance is re-distributed according to a new criterion based on MTF similarity. If the MTF similarity is less than a certain value it can be regarded that the system can tolerate the residual error. The new error tolerance is displayed and it is shown that the wavefront coding technology can also loosen the error distributing besides extended the depth of focus.