中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
长春光学精密机械与物... [5]
西安光学精密机械研究... [1]
采集方式
OAI收割 [6]
内容类型
会议论文 [6]
发表日期
2019 [1]
2011 [1]
2010 [3]
2009 [1]
学科主题
筛选
浏览/检索结果:
共6条,第1-6条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
提交时间升序
提交时间降序
发表日期升序
发表日期降序
题名升序
题名降序
作者升序
作者降序
Structural design of zoom system based on linear motor
会议论文
OAI收割
Beijing, China, 2019-07-07
作者:
Yang, Xiaofan
;
Yang, Hongtao
  |  
收藏
  |  
Effect of gimbal point displacement on optical axis pointing precision in an image seeker (EI CONFERENCE)
会议论文
OAI收割
2011 International Conference on Electric Information and Control Engineering, ICEICE 2011, April 15, 2011 - April 17, 2011, Wuhan, China
作者:
Zhang X.
;
Zhang X.
;
Zhang X.
收藏
  |  
The research of H mixed sensitivity method for line-of-sight stabilization for Carrier-Based theodolite (EI CONFERENCE)
会议论文
OAI收割
2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China
Hua C. L.
;
Bin G. H.
;
Mei Z. S.
收藏
  |  
The method on the measurement of the aircraft attitude by the spatial cosines relationship of the single station and planes to the intersection the multi-station of electro-optical theodolite (EI CONFERENCE)
会议论文
OAI收割
2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China
Zhao L.-R.
;
Cao Y.-G.
收藏
  |  
Influence of spatial temperature distribution on high accuracy interferometric metrology (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Yang H.
;
Zhang J.
;
Zhang J.
;
Zhang J.
;
Yan F.
收藏
  |  
Small roll angle measurement based on auto-collimation and moire fringe (EI CONFERENCE)
会议论文
OAI收割
2009 International Conference on Optical Instruments and Technology - Optoelectronic Measurement Technology and Systems, October 19, 2009 - October 22, 2009, Shanghai, China
Bai X.-G.
;
Cai S.
;
Qiao Y.-F.
;
Dai M.
收藏
  |