机构

• 长春光学精密机械与物... [1]
• 兰州化学物理研究所 [1]

采集方式

• OAI收割 [2]

内容类型

• 会议论文 [1]
• 学位论文 [1]

发表日期

• 2016 [1]
• 2010 [1]

学科主题

• 半导体材料与器件 [1]

筛选

浏览/检索结果: 共2条，第1-2条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序作者升序作者降序题名升序题名降序发表日期升序发表日期降序 (n11)取向GaAsN外延材料的Si掺杂行为及肖特基接触特性研究 学位论文  OAI收割 工程硕士, 北京: 中国科学院大学, 2016 作者:  董琛 收藏  |  浏览/下载：66/0  |  提交时间：2016/11/24 GaAsN  生长取向  外延生长  光电特性  Growth orientation  Epitaxial growth  Optoelectronic characteristics   The research on the automatic measurement of frequency characteristics of opto-electronic platform (EI CONFERENCE) 会议论文  OAI收割 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China 作者:  Liu H.;  Liu H.;  Chen J.;  Liu H. 收藏  |  浏览/下载：34/0  |  提交时间：2013/03/25 A new frequency characteristic test method is proposed based on the digitization characteristics of optoelectronic platform servo system. First a digital processing controller is used to automatically test the entire process and tested data are uploaded to a PC through CAN-bus  and then the tested data are transferred into accurate transfer function with the Levy method. Here we discuss the testing steps  the data processing  the extraction  the Bode diagram plotting and the model identification in detail. The corresponding experiments are carried out  and the results show that the method is simple with the features of high efficiency  high precision and engineering feasibility. 2010 IEEE.