中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
长春光学精密机械与物... [6]
武汉岩土力学研究所 [1]
采集方式
OAI收割 [7]
内容类型
会议论文 [6]
期刊论文 [1]
发表日期
2021 [1]
2012 [1]
2010 [3]
2007 [1]
2005 [1]
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Influence of the Choice of Reference Planes on the Determination of 2D and 3D Joint Roughness Parameters
期刊论文
OAI收割
ROCK MECHANICS AND ROCK ENGINEERING, 2021, 页码: 14
作者:
Wong, Louis Ngai Yuen
;
Meng, Fanzhen
;
Zhou, Hui
;
Yu, Jin
;
Cheng, Guangtan
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收藏
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Improved method of target detection on optoelectronic hybrid joint transform correlator in cluttered scences (EI CONFERENCE)
会议论文
OAI收割
2011 3rd International Conference on Mechanical and Electronics Engineering, ICMEE 2011, September 23, 2011 - September 25, 2011, Hefei, China
作者:
Yang L.
;
Yang L.
收藏
  |  
Method of improving the accuracy of image motion measurement for panoramic aerial cameras (EI CONFERENCE)
会议论文
OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, April 26, 2010 - April 29, 2010, Dalian, China
作者:
Jia P.
收藏
  |  
Design of co-path scanning long trace profiler for measurement of X-ray space optical elements (EI CONFERENCE)
会议论文
OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Shun L.
;
Yan G.
;
Wei Z.
;
Yang Z.
收藏
  |  
Thermal difference analysis and athermalization design of infrared optical system (EI CONFERENCE)
会议论文
OAI收割
Optical Design and Testing IV, October 18, 2010 - October 20, 2010, Beijing, China
作者:
Zhang X.
;
Zhang X.
;
Zhang X.
收藏
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Study of high precision non-contact measurement based on CCD (EI CONFERENCE)
会议论文
OAI收割
4th International Conference on Information Technology and Applications, ICITA 2007, January 15, 2007 - January 18, 2007, Harbin, China
Lin L.
;
Yun F.
收藏
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Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE)
会议论文
OAI收割
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Zhou C.
;
Li H.
;
Chen C.
;
Zhou C.
;
Qian S.
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