中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
光电技术研究所 [1]
过程工程研究所 [1]
上海光学精密机械研究... [1]
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OAI收割 [3]
内容类型
期刊论文 [2]
会议论文 [1]
发表日期
2016 [1]
2007 [1]
1905 [1]
学科主题
Molecular ... [1]
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Thickness measurement of transparent film by white-light interferometry
期刊论文
OAI收割
Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 2016, 卷号: 9685, 页码: 968506
作者:
Deng, Qinyuan
;
Zhou, Yi
;
Liu, Junbo
;
Yao, Jingwei
;
Hu, Song
  |  
收藏
  |  
浏览/下载:33/0
  |  
提交时间:2018/06/14
Film Thickness
Manufacture
Materials Testing
Optical Devices
Optical Films
Reflection
Reflectometers
Structural Design
Thickness Gages
Thickness Measurement
Thin Films
Detection of Brillouin scattering temperature signal in Brillouin optical time-domain reflectometer sensing system based on instantaneous frequency measurement technology
期刊论文
OAI收割
opt. eng., 2007, 卷号: 46, 期号: 12, 页码: 12441
孙安 and 陈柏
;
陈嘉琳
;
Li Guoyang
;
Wang Li
;
Chang Liping
;
林尊琪
收藏
  |  
浏览/下载:1955/259
  |  
提交时间:2009/09/18
Coherent light
Frequency shift keying
Optical fibers
Reflectometers
Temperature measurement
Time domain analysis
Dielectric properties of water and NaCl solutions investigated by terahertz time-domain spectroscopy
会议论文
OAI收割
October 28, 2021 - October 31, 2021
作者:
Cai, He
;
Chen, Wei
;
Zhu, Xianli
;
Li, Liangsheng
;
Li, Jinchun
  |  
收藏
  |  
浏览/下载:0/0
  |  
提交时间:2023/06/16
Plasmons - Reflectometers - Ions - Laser pulses - Reflection - Spectrophotometers - Terahertz spectroscopy - Permittivity - Permittivity measurement - Sodium chloride - Time domain analysis