中国科学院机构知识库网格系统: 检索

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	Superhigh Electromagnetic Interference Shielding of Ultrathin Aligned Pristine Graphene Nanosheets Film 期刊论文 OAI收割 ADVANCED MATERIALS, 2020, 卷号: 32, 期号: 14, 页码: 9 作者: Wei, Qinwei; Pei, Songfeng; Qian, Xitang; Liu, Haopeng; Liu, Zhibo \| 收藏 \| 浏览/下载：12/0 \| 提交时间：2021/02/02 composites electromagnetic interference shielding graphene laminated films scanning centrifugal casting
	Superhigh Electromagnetic Interference Shielding of Ultrathin Aligned Pristine Graphene Nanosheets Film 期刊论文 OAI收割 ADVANCED MATERIALS, 2020, 页码: 9 作者: Wei, Qinwei; Pei, Songfeng; Qian, Xitang; Liu, Haopeng; Liu, Zhibo \| 收藏 \| 浏览/下载：22/0 \| 提交时间：2021/02/02 composites electromagnetic interference shielding graphene laminated films scanning centrifugal casting
	Piecewise Linear Weighted Iterative Algorithm for Beam Alignment in Scanning Beam Interference Lithography 期刊论文 OAI收割 Photonic Sensors, 2019, 卷号: 9, 期号: 4, 页码: 344-355 作者: Y.Song; Bayanheshig; S.Li; S.Jiang; W.Wang \| 收藏 \| 浏览/下载：29/0 \| 提交时间：2020/08/24 Piecewise linear weighted iterative algorithm,beam alignment,scanning,beam interference lithography (SBIL),overshoot suppression,convergence,speed,femtosecond laser,fabrication,gratings,crystal,system,Instruments & Instrumentation,Optics
	Quasiparticle interference in unconventional 2d systems 期刊论文 iSwitch采集 Journal of physics: condensed matter, 2017, 卷号: 29, 期号: 10 作者: Chen,Lan; Cheng,Peng; Wu,Kehui 收藏 \| 浏览/下载：62/0 \| 提交时间：2019/05/09 Quasiparticle particle interference Scanning tunneling microscopy Silicene 2d materials
	Aspheric surface reconstruction for scanning interference 期刊论文 OAI收割 OPTIK, 2014, 卷号: 125, 期号: 11, 页码: 2587-2591 作者: Li, Lulu; Zhao, Wenchuan; Wu, Fan; Liu, Yong; Fan, Bin 收藏 \| 浏览/下载：23/0 \| 提交时间：2015/07/10 Surface reconstruction Scanning interference Zernike polynomials Normal congruence Iterative integration
	Design of co-path scanning long trace profiler for measurement of X-ray space optical elements (EI CONFERENCE) 会议论文 OAI收割 6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China Shun L.; Yan G.; Wei Z.; Yang Z. 收藏 \| 浏览/下载：29/0 \| 提交时间：2013/03/25 The Long Trace Profiler (LTP) is a precision surface slope error measurement instrument used in synchrotron radiation optics for many years. By making some modifications to the LTP system we developed a co-path scanning LTP (CSLTP) system to test the cylindrical aspherical surface which used in X-ray space optics. To reduce the mistake caused by air turbulence and manufacture faults of optical elements used the CSLTP is designed with the least difference between the testing beam path and the reference beam path. Also it uses multiple-beam interference but double beam interference to reduce the width of beam fringe. This improves the position precision of the beam fringe on the image plane. 2010 SPIE.
	The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文 OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏 \| 浏览/下载：18/0 \| 提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.