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An underlying clock in the extreme flip-flop state transitions of the black hole transient Swift J1658.2-4242 期刊论文  OAI收割
Astronomy and Astrophysics, 2020, 卷号: 641, 页码: A101
作者:  
HXMT
  |  收藏  |  浏览/下载:60/0  |  提交时间:2022/02/08
accretion  accretion disks  black hole physics  X-rays: binaries  time  Astrophysics - High Energy Astrophysical Phenomena  Abstract:
Aims: Flip-flops are top-hat-like X-ray flux variations, which have been observed in some transient accreting black hole binary systems, and feature simultaneous changes in the spectral hardness and the power density spectrum (PDS). They occur at a crucial time in the evolution of these systems, when the accretion disc emission starts to dominate over coronal emission. Flip-flops remain a poorly understood phenomenon, so we aim to thoroughly investigate them in a system featuring several such transitions.
Methods: Within the multitude of observations of Swift J1658.2-4242 during its outburst in early 2018, we detected 15 flip-flops, enabling a detailed analysis of their individual properties and the differences between them. We present observations by XMM-Newton, NuSTAR, Astrosat, Swift, Insight-HXMT, INTEGRAL, and ATCA. We analysed their light curves, searched for periodicities, computed their PDSs, and fitted their X-ray spectra, to investigate the source behaviour during flip-flop transitions and how the interval featuring flip-flops differs from the rest of the outburst.
Results: The flip-flops of Swift J1658.2-4242 are of an extreme variety, exhibiting flux differences of up to 77% within 100 s, which is much larger than what has been seen previously. We observed radical changes in the PDS simultaneous with the sharp flux variations, featuring transitions between the quasi-periodic oscillation types C and A, which have never been observed before. Changes in the PDS are delayed, but more rapid than changes in the light curve. Flip-flops occur in two intervals within the outburst, separated by about two weeks in which these phenomena were not seen. Transitions between the two flip-flop states occurred at random integer multiples of a fundamental period of 2.761 ks in the first interval and 2.61 ks in the second. Spectral analysis reveals the high and low flux flip-flop states to be very similar, but distinct from intervals lacking flip-flops. A change of the inner temperature of the accretion disc is responsible for most of the flux difference in the flip-flops. We also highlight the importance of correcting for the influence of the dust scattering halo on the X-ray spectra.
  
A Similar-Curve Based Auto-sorting Algorithm for Panoramic Images 期刊论文  OAI收割
CHINESE JOURNAL OF ELECTRONICS, 2011, 卷号: 20, 期号: 4, 页码: 681-685
作者:  
Xiang Yao;  Long Haixia;  Zou Beiji;  Meng Zhigang
收藏  |  浏览/下载:25/0  |  提交时间:2015/11/08
Graph fitting test method for the interpolation error of Moire fringe (EI CONFERENCE) 会议论文  OAI收割
9th International Conference on Electronic Measurement and Instruments, ICEMI 2009, August 16, 2009 - August 19, 2009, Beijing, China
作者:  
Sun Y.;  Sun Y.
收藏  |  浏览/下载:30/0  |  提交时间:2013/03/25
In order to realize the fast test for the interpolation error  the graph fitting test method for the interpolation error of Moire fringe is put forward in this paper. Firstly  the triangular wave Moire fringe photoelectric signal of the encoder whose phase difference is 90 are sampled to get the Lissajous graph of the two signals. Secondly  the single wave represented by the founded subsection function is used to fit the practical Moire fringe Lissajous graph. Then  the fitting result is tested to verify whether it satisfies the accuracy requirement. Lastly  the founded subsection function instead of the practical wave function is used to calculate the interpolation error. Using the graph fitting method to sample the Moire fringe single of 15-bits photoelectric encoder to get the interpolation error curve  the tested maximum interpolation error is 70" and the minimum error is - 69". Comparing with the interpolation error which is received from traditional test method  the change trend of the interpolation error curve is similar  and peak-peak value is almost equality. The results of experiment indicate that: the equipment is convenient and the examination method is efficient and feasible. The measure speed is fast and the manifestation result is intuitionistic. The system can be used in the working field. The method can avoid the speed influence and realize the dynamic interpolation error measure  which is significant for the research of encoder's dynamic accuracy characteristics. 2009 IEEE.