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Mapping of Land Cover Over Highly Heterogeneous Areas in Yunnan Province With Active and Passive Remotely Sensed Data 期刊论文  OAI收割
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING, 2024, 卷号: 62, 页码: 16
作者:  
Zhang, Tao;  Tang, Bo-Hui;  Zhao, Zhifang
  |  收藏  |  浏览/下载:9/0  |  提交时间:2024/12/30
Multi-IMF Sample Entropy Features with Machine Learning for Surface Texture Recognition Based on Robot Tactile Perception 期刊论文  OAI收割
International Journal of Humanoid Robotics, 2021, 卷号: 18, 期号: 2, 页码: 1-18
作者:  
Shao SL(邵士亮);  Wang T(王挺);  Su Y(苏赟);  Yao C(姚辰);  Song CH(宋纯贺)
  |  收藏  |  浏览/下载:31/0  |  提交时间:2021/05/13
Strength Characteristics and Slope Stability Analysis of Expansive Soil with Filled Fissures 期刊论文  OAI收割
APPLIED SCIENCES-BASEL, 2020, 卷号: 10, 期号: 13, 页码: 16
作者:  
Dai, Zhangjun;  Guo, Jianhua;  Luo, Hongming;  Li, Jian;  Chen, Shanxiong
  |  收藏  |  浏览/下载:32/0  |  提交时间:2021/05/25
Surface Engineering of Carbon Fiber Paper toward Exceptionally High-Performance and Stable Electrochemical Nitrite Sensing 期刊论文  OAI收割
ACS SENSORS, 2019, 卷号: 4, 期号: 11
作者:  
Zhu, Wenxin;  Zhang, Yi;  Gong, Jiandong;  Ma, Yiyue;  Sun, Jing
  |  收藏  |  浏览/下载:35/0  |  提交时间:2020/11/25
Global Modern Charcoal Dataset (GMCD): A tool for exploring proxy-fire linkages and spatial patterns of biomass burning 期刊论文  OAI收割
QUATERNARY INTERNATIONAL, 2018, 期号: 488, 页码: 3-17
作者:  
Kehrwald, Natalie
  |  收藏  |  浏览/下载:66/0  |  提交时间:2018/09/19
基于DEM的地壳运动模拟系统地形拟合与控制方法研究 学位论文  OAI收割
工学博士, 中国科学院自动化研究所: 中国科学院大学, 2015
作者:  
马庆增
收藏  |  浏览/下载:90/0  |  提交时间:2015/09/02
Evaluation of the realism of climate reconstruction using the Coexistence Approach with modern pollen samples from the Qinghai-Tibetan Plateau 期刊论文  OAI收割
REVIEW OF PALAEOBOTANY AND PALYNOLOGY, 2015, 卷号: 219, 页码: 172-182
作者:  
Zhang, Zhi-Yong;  Harrison, Sandy P.;  Mosbrugger, Volker;  Ferguson, David K.;  Paudayal, Khum N.
  |  收藏  |  浏览/下载:45/0  |  提交时间:2022/09/13
Information extraction from laser speckle patterns using wavelet entropy techniques (EI CONFERENCE) 会议论文  OAI收割
MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, November 4, 2011 - November 6, 2011, Guilin, China
作者:  
Li X.-Z.;  Wang X.-J.
收藏  |  浏览/下载:45/0  |  提交时间:2013/03/25
A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper  we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case  we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values  the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore  we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality. 2011 SPIE.  
The research of the accurate measure of static transfer function for the TDI CCD camera (EI CONFERENCE) 会议论文  OAI收割
3rd International Photonics and OptoElectronics Meetings, POEM 2010, November 2, 2010 - November 5, 2010, Wuhan, China
Guo-Ning L.; Long-Xu J.; Jian-Yue R.; Wen-Hua W.; Shuang-Li H.
收藏  |  浏览/下载:31/0  |  提交时间:2013/03/25
In the test course of static transfer function of TDI CCD camera  because of the influence that gets environmental and artificial etc. factor  the value of static transfer function measured at any time is between unceasing fluctuation  so  make accuracy reduce. To solve this problem  a kind of accurate measurement technique of static transfer function is put forward. First  before carrying out the measure of static quiet of transfer function  the best test point of transfer function of the TDI CCD camera must be determined  it is parallel to guarantee the rectangle target surface of parallel optical pipe and camera focal plane maintenance parallel  and again guarantee target strip in rectangle target and TDI CCD in camera focal plane maintenance vertical. TDI CCD catches rectangle target image  per 1000 lines of target mark image as a measures sample of static transfer function  exclude because of atmosphere tremble twisted  vague rectangle target mark image  retain 500 distinct and steady target mark image as measure sample set. Then  calculate the static transfer function of each measure sample respectively  take the average of all static quiet transfer function in measure sample set as the static transfer function of camera. Finally  the measure of the static transfer function for TDI CCD camera makes error analysis. Experimental results indicate that the value of the static transfer function of TDI CCD camera measured with this kind of method is 0.2923  with before measurement technique comparison  the value of static transfer function has raised 0.02  makes the accuracy of the measure of static transfer function have gotten raising.  
In situ long trace profiler for measurement of Wolter type-I mirror (EI CONFERENCE) 会议论文  OAI收割
Advances in Metrology for X-Ray and EUV Optics III, August 1, 2010 - August 2, 2010, San Diego, CA, United states
作者:  
Chen B.;  Chen B.
收藏  |  浏览/下载:37/0  |  提交时间:2013/03/25
The surface profile of Wolter type-I mirror has a great impact on the performance of Solar X-ray Telescope. According to the existing fabrication instrument and experimental conditions in our lab  an in situ Long Trace Profiler is developed and set up on the fabrication instrument in order to measure the surface profile of Wolter mirror in real time during fabrication process. Its working mechanism  structural parameters and data processing algorithm are investigated. The prototype calibrated by a standard plane mirror is used to measure a sample of Wolter type-I mirror. The results show that our prototype can achieve an accuracy of 2.6rad rms for slope error with a stability of 1.33rad during the whole measurement period. This can meet further fabrication requirements. 2010 Copyright SPIE - The International Society for Optical Engineering.