机构

• 宁波材料技术与工程研... [2]
• 长春光学精密机械与物... [1]
• 上海硅酸盐研究所 [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2020 [2]
• 2016 [1]
• 2008 [1]

学科主题

• Chemistry [1]
• Materials ... [1]
• Physics [1]

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Influence of deposition temperature on the structure, optical and electrical properties of a-C films by DCMS 期刊论文  OAI收割 APPLIED SURFACE SCIENCE, 2020, 卷号: 503 作者:  Li, Hao;  Guo, Peng;  Zhang, Dong;  Chen, Rende;  Zuo, Xiao   |  收藏  |  浏览/下载：224/0  |  提交时间：2019/12/18 DIAMOND-LIKE-CARBON  AMORPHOUS-CARBON  SUBSTRATE-TEMPERATURE  THIN-FILMS  GROWTH  SPECTROSCOPY  SP(3)  TAUC  GAP  ARC   Influence of deposition temperature on the structure, optical and electrical properties of a-C films by DCMS 期刊论文  OAI收割 APPLIED SURFACE SCIENCE, 2020, 卷号: 503 作者:  Li, Hao;  Guo, Peng;  Zhang, Dong;  Chen, Rende;  Zuo, Xiao   |  收藏  |  浏览/下载：30/0  |  提交时间：2020/12/16 DIAMOND-LIKE-CARBON  AMORPHOUS-CARBON  SUBSTRATE-TEMPERATURE  THIN-FILMS  GROWTH  SPECTROSCOPY  SP(3)  TAUC  GAP  ARC   Temperature-dependent phonon Raman scattering and spectroscopic ellipsometry of pure and Ca-doped SrxBa1-xNb2O6 ferroelectric ceramics across the phase transition region 期刊论文  OAI收割 JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 卷号: 49, 期号: 3 作者:  Peng, Liang;  Jiang, Kai;  Zhang, Jinzhong;  Hu, Zhigao;  Wang, Genshui 收藏  |  浏览/下载：15/0  |  提交时间：2017/03/01 relaxor ferroelectrics  phase transition  Tauc gap   Ion beam sputter deposition of zirconia thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Liu L.;  Yang H. 收藏  |  浏览/下载：19/0  |  提交时间：2013/03/25 We determined the optical constants (the refractive index n and the extinction coefficient k) of ion beam sputter deposited zirconia thin films with spectroscopic ellipsometry (SE). First  we obtained the structure information (the layer thickness  surface roughness and layer diffusion) by fitting the grazing x-ray reflection (GXRR) spectra. The fitted surface roughness is verified by atomic force micrometer (AFM) measurement. Second  based on the acquired structure information  the measured ellipsometry spectra are fitted in the range of 240-800nm at an incident angle of 70.25 degree. The optical constants are solved based on the Tauc-Lorentz dispersion. The optical band gap extracted by SE is 4.79eV. Finally  the optical band gap is verified by Taue plot method  which is well consistent with that of SE.