机构

• 长春光学精密机械与物... [3]
• 金属研究所 [1]

采集方式

• OAI收割 [4]

内容类型

• 会议论文 [3]
• 期刊论文 [1]

发表日期

• 2017 [1]
• 2007 [1]
• 2006 [2]

学科主题

• Materials ... [1]
• Nanoscienc... [1]

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Ultrasensitive and Highly Selective Photodetections of UV-A Rays Based on Individual Bicrystalline GaN Nanowire 期刊论文  OAI收割 ACS APPLIED MATERIALS & INTERFACES, 2017, 卷号: 9, 期号: 3, 页码: 2669-2677 Zhang, Xinglai; Liu, Baodan; Liu, Qingyun; Yang, Wenjin; Xiong, Changmin; Li, Jing; Jiang, Xin 收藏  |  浏览/下载：33/0  |  提交时间：2017/08/17 GaN  bicrystalline nanowires  HRTEM  UV-A ray  photodetectors   Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文  OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者:  Liu L.;  Yang H.;  Liu L. 收藏  |  浏览/下载：42/0  |  提交时间：2013/03/25 A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data  which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known  the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result  quite good fitting results are obtained with high accuracy. Finally  an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.   Temperature-enhanced ultraviolet emission in ZnO thin film (EI CONFERENCE) 会议论文  OAI收割 Zhang Y. J.; Xu C. S.; Liu Y. C.; Liu Y. X.; Wang G. R.; Fan X. W. 收藏  |  浏览/下载：30/0  |  提交时间：2013/03/25 We have studied the structural and optical properties of ZnO thin films prepared by thermal oxidation of ZnS films deposited by plasma assisted electron-beam evaporation on Si(1 0 0) substrates. The transformation from zinc blende ZnS to hexagonal wurtzite ZnO is confirmed by Raman and X-ray diffraction (XRD) measurement. For the sample thermally oxidized at 600 C for 2 h  a novel UV emission peak Ix located at 3.22 eV (385 nm) has been observed. The temperature-dependent photoluminescence spectra show that the integrated intensity of Ix increases exponentially with increasing temperatures within the measuring temperature range  from 80 to 300 K  but the peak position remains nearly constant. We explain this behavior in terms of electron tunneling into the radiative recombination centers.   Field emission properties of ZnO nanowires (EI CONFERENCE) 会议论文  OAI收割 ICO20: Display Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China Meng X. Q.; Shen D. Z.; Zhang J. Y.; Zhao D. X.; Lu Y. M.; Zhang Z. Z.; Fan X. W. 收藏  |  浏览/下载：27/0  |  提交时间：2013/03/25 ZnO nanowires were obtained by using a simple vapor solid process. The length of the nanowires is about 1 m  with diameters ranging from 40 nm to 150 nm. X-ray diffraction (XRD) pattern confirms the nanowires are wurtzite structure with c-axis preferred orientation. Photoluminescence (PL) measurement shows a strong UV emission and a weak visible emission. Field emission (FE) results proved the nanowires have low turn-on voltage and high field enhancement factor  which indicates ZnO nanowire is a suitable candidate for field emission display.