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CAS IR Grid
机构
物理研究所 [1]
长春光学精密机械与物... [1]
青岛生物能源与过程研... [1]
烟台海岸带研究所 [1]
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OAI收割 [4]
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期刊论文 [3]
会议论文 [1]
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2018 [1]
2014 [1]
2007 [1]
2004 [1]
学科主题
生物材料::先进功能... [1]
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Portable microfluidic chip electrophoresis device with integrated Pt electrodes for the analysis of AgNPs
期刊论文
OAI收割
MICRO & NANO LETTERS, 2018, 卷号: 13, 期号: 3, 页码: 302-305
作者:
Han, Haitao
;
Zheng, Zhaoxia
;
Pan, Dawei
  |  
收藏
  |  
浏览/下载:48/0
  |  
提交时间:2018/04/20
Microfluidics
Lab-on-a-chip
Platinum
Microelectrodes
Nanoparticles
Thin Films
Voltammetry (Chemical Analysis)
Electrophoresis
Oxidation
Portable Instruments
Portable Microfluidic Chip Electrophoresis Device
Integrated Platinum Thin Film Electrodes
Agnps Analysis
Su-8-pyrex Microfluidic Chip
Electrophoresis Instrument
Reusable Holder
Electrochemical Oxidation Behaviours
Lab-on-a-chip Platform
Cyclic Voltammetry
Running Buffer
Separation Voltage
Detection Potential
Microfluidic Platform
Silver Nanoparticle Analysis
Voltage 0
2 v To 0
4 v
Pt
Ag
Benzo[1,2-b:4,5-b′]dithiophene and benzotriazole based small molecule for solution-processed organic solar cells
期刊论文
OAI收割
Organic Electronics, 2014, 卷号: 15, 期号: 2, 页码: 405-413
Chen, Y.
;
Du, Z.
;
Chen, W.
;
Liu, Q.
;
Sun, L.
;
Sun, M.
;
Yang, R.
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2014/03/25
Small molecule
Solution-processed
High open-circuit voltage
Organic solar cells
Benzo[1,2-b:4,5-b0]dithiophene
Benzotriazole
The effect of N/Si ratio on the a-SiiH/SiNx interface of a-SirH/SiNx TFT (EI CONFERENCE)
会议论文
OAI收割
Asia Display 2007, AD'07, March 12, 2007 - March 16, 2007, Shanghai, China
Liu J. e.
;
Gao W.
;
Liao Y.
;
Jing H.
;
Fu G.
收藏
  |  
浏览/下载:28/0
  |  
提交时间:2013/03/25
The threshold voltage of a-Si: H/SiNx TFT will shift under long time gate bias stress
it is mostly leaded by charge trapping in gate insulator and defect creation in semiconductor. And it is hard to be applied in AMOLED for TFT because of its threshold voltage shift. In allusion to the phenomenon of charge trapping
a series of SiNx insulating films in different N/Si(0. 87 -1.68) ratio were deposited by PECVD in this paper
controlling different flow ratio of source gas SiH4 and NH3
and a great deal of tests (ellipsometer
infrared absorption (FTIR) and Electron Dispersion Spectrum (EDS) test ) were done on these samples. Based on these SiNx insulators
three different capacitance samples in MIS structure were done
degraded experiments and C-V tests on these samples were done. The C-V curve shift of capacitance which contained SiNx with slightly N-rich(N/Si is bigger slightly than 1. 33) was not evident before and after degradation
this result indicated that the defect density of this type SiN x was smaller
and could restrain charge chapping in the interface of a-Si:H/SiNx effectively. So that as gate insulator of TFT
SiN x with slightly N-rich could decrease the threshold voltage shift of TFT and enhance its stability effectively.
Synthesis and electrochemical performance of spinel LiMn2-x-yNixCryO4 as 5-V cathode materials for lithium ion batteries
期刊论文
OAI收割
JOURNAL OF POWER SOURCES, 2004, 卷号: 132, 期号: 1-2, 页码: 161
Sun, Y
;
Wang, Z
;
Huang, XJ
;
Chen, LQ
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/09/24
LICRYMN2-YO4 0-LESS-THAN-OR-EQUAL-TO-Y-LESS-THAN-OR-EQUAL-TO-1 COMPOUNDS
POSITIVE-ELECTRODE MATERIALS
SUPERFICIAL PROCESSES
CR CONTENT
LIMN2O4
VOLTAGE
CELLS
BEHAVIOR
METAL
BULK