中国科学院机构知识库网格系统: 检索

Speckle-correlation-based non-line-of-sight imaging under white-light illumination 期刊论文 OAI收割
Optics and Laser Technology, 2024, 卷号: 170
作者: Zhou, Meiling; Zhang, Yang; Wang, Ping; Li, Runze; Peng, Tong

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收藏 | 浏览/下载：32/0 | 提交时间：2023/11/23

Non-line-of-sight imaging Speckle correlation White-light illumination Zernike polynomial fitting

Testing of Annular Hyperboloid Mirror for Cassegrain System 会议论文 OAI收割
Xian, PEOPLES R CHINA, 2020-10-15
作者: Hao, Sanfeng; Zhang, Jian; An, Fei; Yang, Jianfeng

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收藏 | 浏览/下载：31/0 | 提交时间：2021/07/23

Optical testing Aspherics Zernike polynomial Compensator design Optical coating

利用光场传感器重建波前相位的仿真研究 期刊论文 OAI收割
大气与环境光学学报, 2020, 卷号: 15
作者: 刘瑶; 乔春红; 冯晓星; 张京会; 王海涛

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收藏 | 浏览/下载：26/0 | 提交时间：2020/10/26

plenoptic sensor Zernike polynomial aberration phase reconstruction 光场传感器 Zernike多项式像差相位重建

Thermal optics property study and athermal design on optical window of IR aiming device reliability testing system 期刊论文 OAI收割
OPTIK, 2017, 卷号: 136, 期号: 无, 页码: 586-594
作者: Lei, Zhang; Ming, Liu; Danni, Li; Zhao, Zhao; Liujund, Zhong

收藏 | 浏览/下载：32/0 | 提交时间：2018/05/25

Reliability Testing System Ir Optical Window Athermal Design Finite Element Analysis Zernike Annular Polynomial

Absolute subaperture testing by multiangle averaging and Zernike polynomial fitting method 期刊论文 OAI收割
OPTICAL ENGINEERING, 2013, 卷号: 52, 期号: 8
作者: Yan, Fengtao; Fan, Bin; Hou, Xi; Wu, Fan

收藏 | 浏览/下载：37/0 | 提交时间：2015/04/17

absolute subaperture testing multiangle averaging Zernike polynomial fitting

Space optical remote sensor of the CAE thermal control index calculation method (EI CONFERENCE) 会议论文 OAI收割
2011 International Conference on Advanced Design and Manufacturing Engineering, ADME 2011, September 16, 2011 - September 18, 2011, Guangzhou, China
作者: Li L.

收藏 | 浏览/下载：24/0 | 提交时间：2013/03/25

The thermal control indicators CAE methods of Space optical remote sensor are analyzed in the presented work. We sat up a thermal optical analysis model for space optical remote sensor. By assuming fully covered by in-orbit temperature load and using the finite element method for thermal deformation analysis we obtained the optical remote sensor surface deformation and displacement under various thermal loading. Using ZERNIKE polynomial wave was fitted to obtain ZERNIKE polynomial coefficients which were incorporated into the optical system design. Using CODE V optical calculation software heat-ray machines under elastic deformation of the system point spread function transfer function (MTF) wave front differential (WFE) etc. were calculated. Image quality changes of remote sensors are discussed in variety assumed cases such as temperature loads of quality change. By repeated iteration critical value of temperature fields meeting the design requirements are obtained for the optical system. Optical indicators were converged to the temperature field indicator then reasonable indicators of thermal control for remote sensors were obtained. For the thermal control design this method provided a reliable basis for design. (2011) Trans Tech Publications Switzerland.

A new method for comparing Zernike circular polynomials with Zernike annular polynomials in annular pupils (EI CONFERENCE) 会议论文 OAI收割
2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China
Jing S.; Dongmei M.

收藏 | 浏览/下载：23/0 | 提交时间：2013/03/25

To compare the difference between Zernike annular polynomial and Zernike circular polynomial an approximate mathematic relationship between Zernike annular polynomial coefficients and SEIDEL coefficients is proposed. A new method is applied in comparing experiment. For real interferometric data of annular wave front the SEIDEL aberration calculated in different ways is removed from the original wave front. Residual astigmatism aberration in annular polynomial way is close to zero but defocus and sphere aberration are 0.002709 -0.00182. The residual SEIDEL using annular polynomial is least. Data used in comparison shows that Zernike annular polynomial is more accurate and meaningful for the decomposition of aberrations and the calculation of Seidel aberrations in annular pupil. The calculation in astigmatism aberration is most accurate and those in defocus and sphere aberration are least accurate when the first 9 terms are used in approximate solving SEIDEL. More coefficients are needed to obtain the real SEIDEL. 2010 IEEE.

Research on automatic Hartmann test of membrane mirror (EI CONFERENCE) 会议论文 OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者: Zhang P.

收藏 | 浏览/下载：28/0 | 提交时间：2013/03/25

Electrostatic membrane mirror is ultra-lightweight and easy to acquire a large diameter comparing with traditional optical elements so its development and usage is the trend of future large mirrors. In order to research the control method of the static stretching membrane mirror the surface configuration must be tested. However membrane mirror's shape is always changed by variable voltages on the electrodes and the optical properties of membrane materials using in our experiment are poor so it is difficult to test membrane mirror by interferometer and null compensator method. To solve this problem an automatic optical test procedure for membrane mirror is designed based on Hartmann screen method. The optical path includes point light source CCD camera splitter and diffuse transmittance screen. The spots' positions on the diffuse transmittance screen are pictured by CCD camera connected with computer and image segmentation and centroid solving is auto processed. The CCD camera's lens distortion is measured and fixing coefficients are given to eliminate the spots' positions recording error caused by lens distortion. To process the low sampling Hartmann test results Zernike polynomial fitting method is applied to smooth the wave front. So low frequency error of the membrane mirror can be measured then. Errors affecting the test accuracy are also analyzed in this paper. The method proposed in this paper provides a reference for surface shape detection in membrane mirror research. 2010 Copyright SPIE - The International Society for Optical Engineering.

Aberration Analysis for Development of Large- Aperture Reflector by Finite element 会议论文 OAI收割
Chengdu, China, 2008-11-19
作者: Yuanjing Peng; Lvjun Yuan

收藏 | 浏览/下载：24/0 | 提交时间：2014/01/02

Large- aperture optical reflector Support Finite element Zernike polynomial Aberration

Annular sub-aperture stitching interferometry for testing of large asphreical surfaces (EI CONFERENCE) 会议论文 OAI收割
International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China
作者: Zheng L.-G.; Zhang X.-J.; Deng W.-J.; Wang X.-K.

收藏 | 浏览/下载：76/0 | 提交时间：2013/03/25

Annular subaperture stitching interferometric technology can test large-aperture and the PV and RMS of residual error of the full aperture phase distribution is 0.027 and 0.0023 high numerical aperture aspheric surfaces with high resolution the relative error of PV and RMS is -0.53% and -0.31% respectively. The results conclude that this splicing model and algorithm are accurate and feasible. So it provides another quantitive measurement for test aspheric surfaces especially for large aperture aspheres besides null-compensation. low cost and high efficiency without auxiliary null optics. In this paper the basic principle and theory of the stitching method are introduced the reasonable mathematical model and effective splicing algorithm are established based on simultaneous least-squares method and Zernike polynomial fitting. The translation errors are eliminated from each subaperture through the synthetical optimization stitching mode it keeps the error from transmitting and accumulating. The numerical simulations have been carried on by this method. As results the surface map of the full aperture after stitching is consistent to the input surface map the difference of PV error and RMS error between them is -0.0074 and -0.00052 ( is 632.8nm) respectively