中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
首页
机构
成果
学者
登录
注册
登陆
×
验证码:
换一张
忘记密码?
记住我
×
校外用户登录
CAS IR Grid
机构
金属研究所 [1]
高能物理研究所 [1]
采集方式
OAI收割 [2]
内容类型
期刊论文 [2]
发表日期
2021 [1]
2004 [1]
学科主题
筛选
浏览/检索结果:
共2条,第1-2条
帮助
条数/页:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
排序方式:
请选择
题名升序
题名降序
提交时间升序
提交时间降序
作者升序
作者降序
发表日期升序
发表日期降序
Synchronous X-ray/Optical QPOs from the Black Hole LMXB MAXI J1820+070
期刊论文
OAI收割
Monthly Notices of the Royal Astronomical Society, 2021
作者:
HXMT
  |  
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2022/02/08
black hole physics
Low Mass X-ray Binaries
accretion
accretion
discs
stars: individual (MAXI J1820+070)
Astrophysics - High Energy
Astrophysical Phenomena
Abstract: We present high-speed optical photometry from SAAO and SALT on the black hole LMXB MAXI J1820+070 (ASSASN-18ey), some of it simultaneous with NICER, Swift and Insight-HXMT X-ray coverage. We detect optical Quasi-Periodic Oscillations (QPOs) that move to higher frequencies as the outburst progresses, tracking both the frequency and evolution of similar X-ray QPOs previously reported. Correlated X-ray/optical data reveal a complex pattern of lags, including an anti-correlation and a sub-second lag that evolve over the first few weeks of outburst. They also show correlated components separated by a lag equal to the QPO period roughly centered on zero lag, implying that the inter-band variability is strongly and consistently affected by these QPOs at a constant phase lag of roughly ±Ю The synchronisation of X-ray and optical QPOs indicates that they must be produced in regions physically very close to each other
we thus propose that they can be explained by a precessing jet model, based on analogies with V404 Cyg and MAXI J1348-630.
Size effect of nano-copper films on complex optical constant and permittivity in frared region
期刊论文
OAI收割
Materials Letters, 2004, 卷号: 58, 期号: 6, 页码: 1117-1120
H. Du
;
S. W. Lee
;
J. Gong
;
C. Sun
;
L. S. Wen
收藏
  |  
浏览/下载:21/0
  |  
提交时间:2012/04/14
magnetron sputtering
nano-copper film
complex optical constant
complex permittivity
size effect
thin-films
reflectance
thickness