机构

• 自动化研究所 [2]
• 计算技术研究所 [1]
• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [4]

内容类型

• 期刊论文 [3]
• 会议论文 [1]

发表日期

• 2023 [1]
• 2005 [1]
• 2004 [2]

学科主题

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Current-Aided Multiple-AUV Cooperative Localization and Target Tracking in Anchor-Free Environments 期刊论文  OAI收割 IEEE/CAA Journal of Automatica Sinica, 2023, 卷号: 10, 期号: 3, 页码: 792-806 作者:  Yichen Li;  Wenbin Yu;  Xinping Guan   |  收藏  |  浏览/下载：23/0  |  提交时间：2023/03/02 Anchor-free  belief propagation  cooperative localization  current-aided  target tracking   Manufacturing and Testing SiC Aspherical mirrors in Space telescopes (EI CONFERENCE) 会议论文  OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China 作者:  Fan D.;  Zhang X.;  Zhang X.;  Zhang X. 收藏  |  浏览/下载：23/0  |  提交时间：2013/03/25 Reaction Bonded (RB) SiC mirrors due to their excellent specific stiffness and thermal properties have been widely used in space telescopes. However  polishing large SiC aspherical mirrors is difficult compared to other materials such as fused silica or Zerodu. In addition  surface roughness of the polished SiC mirrors is limited by the defects of the materials and needs to be improved by means of surface coating technique. This paper introduces the current progress of large SiC aspherical mirrors manufacturing and testing in CIOMP. In particular  the procedures of making large off-axis aspherical mirrors were discussed in detail. A proprietary computer controlled optical surfacing (CCOS) technique was utilized to grind and polish the mirrors and the computer aided null test was used to measure the surface figure. As results  a 600mm class off-axis SiC aspherical mirrors was demonstrated with figure error less than 13nm rms.   Leakage current estimation of CMOS circuit with stack effect 期刊论文  OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2004, 卷号: 19, 期号: 5, 页码: 708-717 作者:   收藏  |  浏览/下载：26/0  |  提交时间：2015/11/08 computer-aided design  leakage current estimation  stack effect  macromodeling  propagation of signal probability   Leakage current estimation of CMOS circuit with stack effect 期刊论文  OAI收割 JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2004, 卷号: 19, 期号: 5, 页码: 708-717 作者:  Xu, YJ;  Luo, ZY;  Li, XW;  Li, LJ;  Hong, XL   |  收藏  |  浏览/下载：16/0  |  提交时间：2019/12/16 computer-aided design  leakage current estimation  stack effect  macromodeling  propagation of signal probability