机构

• 自动化研究所 [14]
• 半导体研究所 [5]
• 苏州纳米技术与纳米仿... [1]
• 沈阳自动化研究所 [1]
• 合肥物质科学研究院 [1]
• 近代物理研究所 [1]
• 更多

采集方式

• OAI收割 [24]
• iSwitch采集 [1]

内容类型

• 期刊论文 [25]

发表日期

• 2026 [1]
• 2025 [1]
• 2024 [4]
• 2023 [2]
• 2022 [2]
• 2021 [5]
• 更多

学科主题

• 半导体材料 [4]

筛选

浏览/检索结果: 共25条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 A multi-defect detection framework for sweet potato based on feature fusion and adaptive attention under complex postharvest conditions 期刊论文  OAI收割 JOURNAL OF STORED PRODUCTS RESEARCH, 2026, 卷号: 116, 页码: 14 作者:  Guo, Xinyu;  Zhang, Jian;  Xiong, Haitao;  Zhang, Tao;  Yang, Ranbing   |  收藏  |   Improved YOLO v5s-based detection method for external defects in potato 期刊论文  OAI收割 FRONTIERS IN PLANT SCIENCE, 2025, 卷号: 16, 页码: 15 作者:  Li, Xilong;  Wang, Feiyun;  Guo, Yalin;  Liu, Yijun;  Lv, Huangzhen   |  收藏  |   Surface defect detection and semantic segmentation with a novel lightweight deep neural network 期刊论文  OAI收割 Measurement Science and Technology, 2024, 卷号: 35, 期号: 8, 页码: 14 作者:  Huang,Qiang;  Li,Fudong;  Yang,Yuequan;  Tao,Xian;  Li,Wei   |  收藏  |   Enhancing Representation Power of Deep Neural Networks With Negligible Parameter Growth for Industrial Applications 期刊论文  OAI收割 IEEE TRANSACTIONS ON SYSTEMS MAN CYBERNETICS-SYSTEMS, 2024, 页码: 12 作者:  Chen, Liangming;  Jin, Long;  Shang, Mingsheng;  Wang, Fei-Yue   |  收藏  |   Industry-oriented Detection Method of PCBA Defects Using Semantic Segmentation Models 期刊论文  OAI收割 IEEE/CAA Journal of Automatica Sinica, 2024, 卷号: 11, 期号: 6, 页码: 1438-1446 作者:  Yang Li;  Xiao Wang;  Zhifan He;  Ze Wang;  Ke Cheng   |  收藏  |   Deep Industrial Image Anomaly Detection: A Survey 期刊论文  OAI收割 Machine Intelligence Research, 2024, 卷号: 21, 期号: 1, 页码: 104-135 作者:  Jiaqi Liu;  Guoyang Xie;  Jinbao Wang;  Shangnian Li;  Chengjie Wang   |  收藏  |   Deep learning based online metallic surface defect detection method for wire and arc additive manufacturing 期刊论文  OAI收割 ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING, 2023, 卷号: 80, 页码: 12 作者:  Li, Wenhao;  Zhang, Haiou;  Wang, Guilan;  Xiong, Gang;  Zhao, Meihua   |  收藏  |   A pixel-level deep segmentation network for automatic defect detection 期刊论文  OAI收割 EXPERT SYSTEMS WITH APPLICATIONS, 2023, 卷号: 215, 页码: 11 作者:  Yang, Lei;  Xu, Shuai   |  收藏  |   Mask-Guided Generation Method for Industrial Defect Images with Non-uniform Structures 期刊论文  OAI收割 MACHINES, 2022, 卷号: 10, 期号: 12, 页码: 17 作者:  Wei, Jing;  Zhang, Zhengtao   |  收藏  |   A nondestructive automatic defect detection method with pixelwise segmentation 期刊论文  OAI收割 KNOWLEDGE-BASED SYSTEMS, 2022, 卷号: 242, 页码: 12 作者:  Yang, Lei;  Fan, Junfeng;  Huo, Benyan;  Li, En;  Liu, Yanhong   |  收藏  |