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浏览/检索结果: 共3条，第1-3条 帮助

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Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文  OAI收割
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei
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Contour Extraction and Quality Inspection for Inner Structure of Deep Hole Components 期刊论文  OAI收割
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2019, 卷号: 9, 期号: 3, 页码: 575-585
作者:  Gong XY(宫新一);  Hu Su;  De Xu;  Huabin Yang;  Zhengtao Zhang
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Contour Extraction and Quality Inspection for Inner Structure of Deep Hole Components 期刊论文  OAI收割
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2018, 期号: 0, 页码: 0
作者:  Zhang ZT(张正涛)
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