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CAS IR Grid
机构
长春光学精密机械与物... [2]
金属研究所 [1]
水生生物研究所 [1]
半导体研究所 [1]
兰州化学物理研究所 [1]
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OAI收割 [6]
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期刊论文 [4]
会议论文 [2]
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2013 [1]
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材料科学与物理化学 [1]
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The Constant Extension Rate Tensile of AZ31B Magnesium Alloy with Si-contained Coating in Dynamic Simulated Body Fluid
期刊论文
OAI收割
Journal of Hard Tissue Biology, 2013, 卷号: 22, 期号: 2, 页码: 177-181
Q. Wang
;
Y. Nakamura
;
I. Kato
;
H. Maeda
;
L. L. Tan
;
K. Yang
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2013/12/24
Magnesium alloys
Constant extension
Intergranular crack
Transgranular
crack
stress-corrosion cracking
in-vitro degradation
mechanical integrity
composite coatings
electrodeposition
hydroxyapatite
behavior
Mechanism and kinetic study on the OH-initiated degradation of 2,3,7,8-tetrachlorinated dibenzofuran in atmosphere
期刊论文
OAI收割
Science of the Total Environment, 2012, 卷号: 435, 页码: 53-60
作者:
Zhang CX(张晨熙)
;
Zhao YY(赵宇阳)
;
Bai J(白静)
;
Gong C(功臣)
;
Sun XM(孙孝敏)
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2013/07/12
2
OH-initiated
Degradation mechanism
Rate constant
Atmospheric lifetime
3
7
8-TeCDF
The research on statistical properties of TDI-CCD imaging noise (EI CONFERENCE)
会议论文
OAI收割
International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, May 24, 2011 - May 26, 2011, Beijing, China
Gu Y.-Y.
;
Shen X.-H.
;
He G.-X.
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  |  
浏览/下载:23/0
  |  
提交时间:2013/03/25
TDI-CCD can improve the sensitivity of space camera without any degradation of spatial resolution which is widely used in aerospace imaging devices. The article describes the basic working principle and application characteristics of TDI-CCD devices
analyses the composition of TDI-CCD imaging noise
and propose a new method to analyze TDI-CCD imaging noise with statistical probability distribution. In order to estimate the distribution of gray values affect by noise we introduced the concept of skewness and kurtosis. We design an experiment using constant illumination light source
take image with TDI-CCD working at different stage such as stage 16
stage 32
stage 48
stage 64 and stage 96
analyse the characteristics of image noise with the method we proposed
experimental results show that the gray values approximately meet normal distribution in large sample cases. 2011 SPIE.
High power vertical cavity surface-emitting laser with high reliability (EI CONFERENCE)
会议论文
OAI收割
Optoelectronic Materials and Devices II, November 2, 2007 - November 5, 2007, Wuhan, China
Changling Y.
;
Guoguang L.
;
Chunfeng H.
;
Li Q.
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  |  
浏览/下载:18/0
  |  
提交时间:2013/03/25
High-power vertical-cavity surface-emitting lasers with InGaAs/GaAs quantum well active gain region are investigated. By using AlAs oxidation technology
the devices have been fabricated in experiment
and the characteristics of the device are carried out at room temperature. The 300m-diameter VCSELs have the maximum room temperature continuous wave (CW) optical output power of about 1.1W
and the threshold current of the device is about 0.46A. The life test of the device is carried out in constant current mode. The life test of 300-m diameter lasers shows that the average lifetime is about 1800h at 80C. The device degradation mechanism is also discussed in detail.
Phytoremediation of triazophos by Canna indica Linn. in a hydroponic system
期刊论文
OAI收割
INTERNATIONAL JOURNAL OF PHYTOREMEDIATION, 2007, 卷号: 9, 期号: 6, 页码: 453-463
作者:
Cheng, Shuiping
;
Xiao, Jin
;
Xiao, Huiping
;
Zhang, Liping
;
Wu, Zhenbin
收藏
  |  
浏览/下载:119/0
  |  
提交时间:2010/10/13
phytoremediation
phytodegradation
organic phosphate substance
triazophos
Canna indica Linn.
hydroponics
degradation constant
removal percentage
phosphatase
Dose rate dependence of electrical characteristics of lead zirconate titanate capacitors
期刊论文
OAI收割
japanese journal of applied physics part 1-regular papers short notes & review papers, 2003, 卷号: 42, 期号: 10, 页码: 6491-6495
Zhang GQ
;
Sun P
;
Zou Q
;
Mei X
;
Ruda HE
;
Gu Q
;
Yu XF
;
Ren DY
;
Yan RL
收藏
  |  
浏览/下载:1284/12
  |  
提交时间:2010/08/12
ionizing radiation
dose rate
PZT
dielectric constant
coercive field
C-V curves
remanent polarization
FERROELECTRIC PZT CAPACITORS
IONIZING-RADIATION
BORDER TRAPS
TRANSISTORS
DEGRADATION
MECHANISMS
MEMORIES
VOLTAGE
DEVICES
RAY