机构

• 计算技术研究所 [2]
• 长春光学精密机械与物... [2]
• 自动化研究所 [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [3]
• 会议论文 [2]

发表日期

• 2011 [2]
• 2010 [2]
• 2005 [1]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择提交时间升序提交时间降序发表日期升序发表日期降序题名升序题名降序作者升序作者降序 Path Delay Test generation Toward Activation of worst Case Coupling Effects 期刊论文  OAI收割 IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者:  minjin, zhang;  Huawei, Li;  Xiaowei,Li   |  收藏  |   Path Delay Test Generation Toward Activation of Worst Case Coupling Effects 期刊论文  OAI收割 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2011, 卷号: 19, 期号: 11, 页码: 1969-1982 作者:  Zhang, Minjin;  Li, Huawei;  Li, Xiaowei   |  收藏  |   High precision test method for dynamic imaging of space camera (EI CONFERENCE) 会议论文  OAI收割 2010 IEEE International Conference on Advanced Computer Control, ICACC 2010, March 27, 2010 - March 29, 2010, 445 Hoes Lane - P.O.Box 1331, Piscataway, NJ 08855-1331, United States 作者:  Jin L.-X.;  Zhang K.;  Zhang K.;  Zhang K.;  Zhang K. 收藏  |   Semi-physical simulation of an optoelectronic tracking servo system based on C MEX S functions (EI CONFERENCE) 会议论文  OAI收割 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China Juan C.; Junhong Z. 收藏  |   Selection of crosstalk-induced faults in enhanced delay test 期刊论文  OAI收割 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2005, 卷号: 21, 期号: 2, 页码: 181-195 作者:  Li, HW;  Li, XW   |  收藏  |