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	Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside-Illuminated CMOS Image Sensors 期刊论文 OAI收割 CHINESE JOURNAL OF ELECTRONICS, 2021, 卷号: 30, 期号: 1, 页码: 180-184 作者: Liu, BK (Liu Bingkai)[ 1,2,3 ]; Li, YD (Li Yudong)[ 1,2 ]; Wen, L (Wen Lin)[ 1,2 ]; Zhou, D (Zhou Dong)[ 1,2 ]; Feng, J (Feng Jie)[ 1,2 ] \| 收藏 \| 浏览/下载：38/0 \| 提交时间：2021/05/10 Backside‐ illuminated CMOS image sensors Dark signal behaviors Displacement damage effects Neutron irradiation
	Dynamic process analysis of the Niumiangou landslide triggered by the Wenchuan earthquake using the finite difference method and a modified discontinuous deformation analysis 期刊论文 OAI收割 JOURNAL OF MOUNTAIN SCIENCE, 2021, 卷号: 18, 期号: 4, 页码: 1034-1048 作者: Huang Da; Meng Qiu-jie; Song Yi-xiang; Cui Sheng-hua; Cen Duo-feng \| 收藏 \| 浏览/下载：19/0 \| 提交时间：2023/08/23 Wenchuan earthquake Discontinuous deformation analysis (DDA) Niumiangou landslide Amplification effects Displacement-dependent friction model
	A study of hot pixels induced by proton and neutron irradiations in charge coupled devices 期刊论文 OAI收割 RADIATION EFFECTS AND DEFECTS IN SOLIDS, 2020, 卷号: 175, 期号: 5-6, 页码: 540-550 作者: Liu, BK (Liu, Bingkai)[ 1,2,3 ]; Li, YD (Li, Yudong)[ 1,2 ]; Wen, L (Wen, Lin)[ 1,2 ]; Zhou, D (Zhou, Dong)[ 1,2 ]; Feng, J (Feng, Jie)[ 1,2 ] \| 收藏 \| 浏览/下载：30/0 \| 提交时间：2020/07/06 Charge coupled devices (CCDs) proton irradiation neutron irradiation hot pixels displacement damage effects
	Effects of topography on dynamic responses of single piles under vertical cyclic loading 期刊论文 OAI收割 JOURNAL OF MOUNTAIN SCIENCE, 2020, 卷号: 17, 期号: 1, 页码: 230-243 作者: Qu Li-ming; Ding Xuan-ming; Wu Chong-rong; Long Yong-hong; Yang Jin-chuan \| 收藏 \| 浏览/下载：15/0 \| 提交时间：2020/11/11 Pile Model test Dynamic response Permanent settlement Vibration displacement Topography effects
	Experimental study of drying effects during supercritical CO2 displacement in a pore network 期刊论文 OAI收割 MICROFLUIDICS AND NANOFLUIDICS, 2018, 卷号: 22, 期号: 9, 页码: - 作者: Wang, Ying; Wei, Ning; Zhang, Changyong; Wietsma, Thomas W.; Bonneville, Alain \| 收藏 \| 浏览/下载：28/0 \| 提交时间：2020/04/08 Drying effects CCS scCO(2)-water displacement Mutual dissolution Micromodel
	Analysis Again for Earth Pressure Calculation Theory Considering Displacement Effects 会议论文 OAI收割 Xian Univ Architecture & Technol, Xian, PEOPLES R CHINA, SEP 22-24, 2011 作者: Yang Taihua; He Huaijian; Gong Xiangchao \| 收藏 \| 浏览/下载：21/0 \| 提交时间：2018/06/05 shear strength reduce nonlimited state displacement effects earth pressure
	Modulation transfer function in seeker camera limits resulting from missile flutter caused by aerodynamic force (EI CONFERENCE) 会议论文 OAI收割 2010 2nd International Conference on Industrial Mechatronics and Automation, ICIMA 2010, May 30, 2010 - May 31, 2010, Wuhan, China 作者: Zhang X.; Zhang X. 收藏 \| 浏览/下载：26/0 \| 提交时间：2013/03/25 The imaging quality of seeker in flight mode has been evaluated through analyzing the effects of missile flutter on optical modulation transfer function (MTF) of the optical system. Firstly the data of transverse vibration has been processed to eliminate the trend term caused by the trajectory then obtained the displacement with two times trapezoidal integration. For the side rotation the high frequency noise interference in the data has been filtered by using five-point moving average method. Took this model as the quivering rule between the object and the image and then analyzed the effects of the transverse vibration and the side rotation on imaging quality through MTF. By calculation the r.m.s value of the image motion caused by missile transverse vibration is 0.026mm and the side rotation angle is 0.0044 . Through the establishment of two modulation transfer functions (MTF) of image random vibration and linear vibration the results show that the image quality had declined and the effect of transverse vibration on image quality is obvious. Through improving the rigidity of the missile and selection of small focal length optical system and shorten the time of exposure can improve the imaging quality of the seeker. 2010 IEEE.