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PARTIALLY LINEAR-MODELS  EFFICIENT ESTIMATION  NONPARAMETRIC-ESTIMATION  Fixed effect  profile likelihood  semi-varying coefficient model for panel data  

We calculate the influence of temperature change on the refractive index of air  establish a model of air temperature distribution and analyze the effect of different temperature distribution on the high accuracy interferometric metrology. First  a revised Edlen formula is employed to acquire the relation between temperature and refractive index of air  followed by introducing the fixed temperature gradient distribution among the spatial grid within the optical cavity between the reference flat and the test flat of the Fizeau interferometer  accompanied by a temperature change random function within each grid. Finally  all the rays through the air layer with different incident angles are traced by Matlab program in order to obtain the final output position  angle and OPD for each ray. The influence of different temperature distribution and the length of the optical cavity in on the testing accuracy can be analyzed through the RMS value that results from repeatable rays tracing. As a result  the horizontal distribution (vertical to optical axis) has a large effect on the testing accuracy. Thus  to realize the high accuracy figure metrology  the horizontal distribution of temperature must be rigorously controlled as well as to shorten the length of the optical cavity to a large extent. The results from our simulation are of great significant for the accuracy analysis of interferometric testing and the research of manufacturing a interferometer. 2010 Copyright SPIE - The International Society for Optical Engineering.  

To absolve image blur of high speed camera  ringing effect and edge effect are analyzed  fixed-point DSP TMS320C6416 and wiener filtering algorithm are adopted. Degeneration model for moving blur is researched  the principle of Wiener filtering is explained: how complete FFT of 32bit and how to exert DMA function of DSP to enhance processing speed  and the test results are presented. 2004 IEEE.