中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Influence of spatial temperature distribution on high accuracy interferometric metrology (EI CONFERENCE) 会议论文  OAI收割
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010, Dalian, China
作者:  
Yang H.
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Error analysis and a new arithmetic study on computing horizontal temperature gradient in marine GIS 会议论文  OAI收割
Shao Q. Q.; Rong K.; You Z. M.; Ma W. W.; Ieee
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