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Chinese Academy of Sciences Institutional Repositories Grid
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基于TPLIF技术的光合荧光参数快速准确测量的激发光强自适应方法 期刊论文  OAI收割
光学学报, 2020, 卷号: 40
作者:  
王翔;  殷高方;  赵南京;  甘婷婷;  覃志松
  |  收藏  |  浏览/下载:32/0  |  提交时间:2021/03/15
Dynamical stochastic resonance for nonuniform illumination image enhancement 期刊论文  OAI收割
IET Image Processing, 2018, 卷号: 12, 期号: 12, 页码: 2147-2152
作者:  
Zhang, Yongbin;  Liu, Hongjun
  |  收藏  |  浏览/下载:53/0  |  提交时间:2018/12/18
Transition intensity calculation of Yb:YAG 期刊论文  OAI收割
CHINESE PHYSICS B, 2018, 卷号: 27, 期号: 6, 页码: 6
作者:  
Zhang, Hong-Bo;  Zhang, Qing-Li;  Wang, Xing;  Sun, Gui-Hua;  Wang, Xiao-Fei
  |  收藏  |  浏览/下载:16/0  |  提交时间:2019/11/11
Modelling sheet erosion on steep slopes in the loess region of China 期刊论文  OAI收割
JOURNAL OF HYDROLOGY, 2017, 卷号: 553, 页码: 549-558
作者:  
Wu, Bing;  Wang, Zhanli;  Zhang, Qingwei;  Shen, Nan;  Liu, June
  |  收藏  |  浏览/下载:28/0  |  提交时间:2019/09/25
Modelling sheet erosion on steep slopes in the loess region of China 期刊论文  OAI收割
JOURNAL OF HYDROLOGY, 2017, 卷号: 553, 页码: 549-558
作者:  
Wu, Bing;  Wang, Zhanli;  Zhang, Qingwei;  Shen, Nan;  Liu, June
  |  收藏  |  浏览/下载:34/0  |  提交时间:2018/04/12
Improved bore-sight calibration for airborne light detection and ranging using planar patches 期刊论文  OAI收割
Journal of Applied Remote Sensing, 2016, 卷号: 10, 期号: 2
作者:  
Li, Dong;  Guo, Huadong;  Wang, Cheng;  Dong, Pinliang;  Zuo, Zhengli
收藏  |  浏览/下载:28/0  |  提交时间:2017/04/24
Source parameters estimation of historical earthquake with magnitude about 6 期刊论文  OAI收割
CHINESE JOURNAL OF GEOPHYSICS-CHINESE EDITION, 2013, 卷号: 56, 期号: 8, 页码: 2701-2717
作者:  
Tan Yi-Pei;  Chen Qi-Fu
  |  收藏  |  浏览/下载:21/0  |  提交时间:2018/09/26
A mechanistic model for the photosynthesis-light response based on the photosynthetic electron transport of photosystem II in C3 and C4 species SCI/SSCI论文  OAI收割
2013
Ye Z. P.; Suggett D. J.; Robakowski P.; Kang H. J.
收藏  |  浏览/下载:49/0  |  提交时间:2014/12/24
Mechanism of STED microscopy and analysis of the factors affecting resolution (EI CONFERENCE) 会议论文  OAI收割
6th International Symposium on Precision Engineering Measurements and Instrumentation, August 8, 2010 - August 11, 2010, Hangzhou, China
Yang P.; Ai H.
收藏  |  浏览/下载:23/0  |  提交时间:2013/03/25
Stimulated emission depletion (STED) microscopy exploits nonlinear saturable optical transition of fluorescent molecules  allowed to overcome Abbe's diffraction-limit and provides diffraction-unlimited resolution in far-field optical microscopy. We elaborate the mechanism of STED and the conditions of depletion. The formula of STED microcopy resolution is deduced through effective point spread function (E-PSF). The STED system resolution is mainly dominated by the quality of the fluorescence depletion patterns in the focal plane. The depletion pattern is mainly affected by STED beam intensity  polarization  phase plate  primary aberrations  STED pulse shape  pulse duration and delay time. In this paper  we found related models and simulate the relationship between the depletion patterns and the parameters  and put forward effective approach to enhance the system resolution. 2010 SPIE.  
Analysis of measuring errors for the visible light phase-shifting point diffraction interferometer (EI CONFERENCE) 会议论文  OAI收割
2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010, December 3, 2010 - December 6, 2010, Guangzhou, China
作者:  
Zhang Y.
收藏  |  浏览/下载:13/0  |  提交时间:2013/03/25
In order to improve the measuring accuracy of the visible light phase-shifting point diffraction interferometer (PS/PDI) for the extreme ultraviolet lithography (EUVL) aspheric mirrors  the main measuring errors will be discussed in this paper. At first  the elementary configuration and measuring principle of the visible light phase-shifting point diffraction interferometer are introduced briefly  then the different errors which are possible to affect the measuring result are summed up  the errors include PZT phase-shifting error  detector nonlinearity error  detector quantization error  wavelength instability error and intensity instability error of the laser source  vibration error  air refractivity instability error and so on. Through detailed analysis and simulation  the magnitude of these errors can be obtained. By analysing the reasons which cause these errors and the relationship between these errors and interferometer configuration parameters  some methods are put forward to avoid or restrain these errors accordingly.