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CAS IR Grid
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长春光学精密机械与物... [1]
西安光学精密机械研究... [1]
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会议论文 [1]
期刊论文 [1]
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2010 [1]
2009 [1]
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Noise processing technology of a TDICCD sensor (EI CONFERENCE)
会议论文
OAI收割
2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010, Changchun, China
作者:
Zhang L.-P.
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2013/03/25
In the application of TDI-CCD
the other is all kinds of interference noise produced in the working process of a TDI-CCD
for reset noise
because of its serious noise interference
such as reset noise and 1 / f noise
correlated double sampling is employed. The experimental results show that after noise processing
the imaging quality is reduced
etc. According to the features of noise
the output S/N has been raised to about 50 dB. 2010 IEEE.
so that it is necessary to study the noise characteristics of TDI-CCD. There are two categories of noise
this paper has studied the corresponding noise-processing technology. For dark current noise
one is the inherent noise
refrigeration is taken
including shot noise
dark current noise
fixed pattern noise and transfer noise etc.
Analysis and calculation of the modulation depth of the Michelson interferometer with wide field, chromatic compensation and thermal compensation
期刊论文
OAI收割
acta physica sinica, 2009, 卷号: 58, 期号: 4, 页码: 2415-2422
作者:
Bu Zhi-Chao
;
Zhang Chun-Min
;
Zhao Bao-Chang
;
Zhu Hua-Chun
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  |  
浏览/下载:47/0
  |  
提交时间:2015/08/27
interference imaging technology
Michelson interferometer
the modulation depth
dual-beam interference