机构

• 长春光学精密机械与物... [2]

采集方式

• OAI收割 [2]

内容类型

• 会议论文 [2]

发表日期

• 2012 [1]
• 2007 [1]

学科主题

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浏览/检索结果: 共2条，第1-2条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序发表日期升序发表日期降序提交时间升序提交时间降序作者升序作者降序 Design of heliostats field for the scale of 1MW solar power tower plant (EI CONFERENCE) 会议论文  OAI收割 2012 Asia-Pacific Power and Energy Engineering Conference, APPEEC 2012, March 27, 2012 - March 29, 2012, Shanghai, China 作者:  Zhang H.;  Wang Z.;  Wang Z.;  Zhang H. 收藏  |  浏览/下载：45/0  |  提交时间：2013/03/25 The development in basic technology and market strategy of solar thermal power techniques is booming rapidly due to the limited fossil resources and severe environmental problems all over the world. In this paper  the design method of heliostats field for the scale of 1MW solar power tower plant with latitude of 40.4N at the design point of the noon of spring equinox is introduced  which uses the multiplication of three efficiencies of cosine  atmospheric transmittance and intercept as the preliminary boundary limit to locate heliostats  while the spacing between heliostats is set not only for less shading and blocking  but also for the availability of installation and maintenance of heliostats. Furthermore  its optical performance tested by the software HFLD  is quite good  which has annual average efficiency of 71.36% and design point efficiency of 80%. 2012 IEEE.   Determination of optical constants of zirconia and silica thin films in UV to visible range (EI CONFERENCE) 会议论文  OAI收割 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, AOMATT 2007: Advanced Optical Manufacturing Technologies, July 8, 2007 - July 12, 2007, Chengdu, China 作者:  Liu L.;  Yang H.;  Liu L. 收藏  |  浏览/下载：50/0  |  提交时间：2013/03/25 A curve fitting method for determining the optical constants of some dielectric thin films is described with dispersion theory in the paper. A computer program based on Matlab is developed and optimized. The fitting errors are analyzed with theoretical data  which gives very high accurate results. A program is applied to fitting the measured photometric spectra of ion sputtered zirconia and silica thin films in 200-850nm spectra range. The thickness is verified with the method of grazing x-ray diffraction. With the thickness known  the optical constants of zirconia films near the absorption range are obtained with single-wavelength method. As a result  quite good fitting results are obtained with high accuracy. Finally  an ultraviolet (UV) high-pass optical filter is designed with optical constants extracted by this method. The transmission and reflection spectra of the filter are measured and compared to designed spectra. A good coherence was derived.