机构

• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [1]

内容类型

• 会议论文 [1]

发表日期

• 2012 [1]

学科主题

筛选

浏览/检索结果: 共1条，第1-1条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems (EI CONFERENCE) 会议论文  OAI收割 2012 International Conference on Optoelectronics and Microelectronics, ICOM 2012, August 23, 2012 - August 25, 2012, Changchun, China 作者:  Sun Z. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 A comparison study on temperature measurement precision between middlewave 3-5m and longwave 8-12m measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target's temperature is in the range of 270K900K. First  the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve  we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target's physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity  limited transmittance of the atmosphere  radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do. 2012 IEEE.