机构

• 长春光学精密机械与物... [1]
• 化学研究所 [1]
• 半导体研究所 [1]
• 合肥物质科学研究院 [1]
• 近代物理研究所 [1]

采集方式

• OAI收割 [4]
• iSwitch采集 [1]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2020 [1]
• 2017 [1]
• 2015 [1]
• 2005 [2]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 2D foaming of ultrathin MXene sheets with highly conductive silver nanowires for wearable electromagnetic interference shielding applications owing to multiple reflections within created free space 期刊论文  OAI收割 NANO FUTURES, 2020, 卷号: 4 作者:  Yin, Hongyu;  Bi, Lili;  Wu, Zhen;  Wang, Guixin;  Li, Mian   |  收藏  |  浏览/下载：47/0  |  提交时间：2020/10/26 electromagnetic interference shielding  silver nanowires  MXene  foaming  multiple reflections   Facile fabrication of micro-grooves based photonic crystals towards anisotropic angle-independent structural colors and polarized multiple reflections 期刊论文  OAI收割 SCIENCE BULLETIN, 2017, 卷号: 62, 期号: 13, 页码: 938-942 作者:  Liu, Chuanyong;  Long, Yue;  Yang, Bingquan;  Yang, Guoqiang;  Tung, Chen-Ho   |  收藏  |  浏览/下载：24/0  |  提交时间：2018/05/25 Photonic Crystal  Bio-inspiration  Angle-independent  Micro-groove  Multiple Reflections   Quantum design using a multiple internal reflections method in a study of fusion processes in the capture of alpha-particles by nuclei 期刊论文  OAI收割 NUCLEAR PHYSICS A, 2015, 卷号: 940, 页码: 89-118 作者:  Maydanyuk, Sergei P.;  Zhang, Peng-Ming;  Belchikov, Sergei V.   |  收藏  |  浏览/下载：15/0  |  提交时间：2018/05/31 Alpha-capture  Tunneling  Multiple internal reflections  Fusion probabilities  Sharp angular momentum cut off  Alpha-decay   Optical waveguide propagation loss measurement using multiple reflections method 期刊论文  iSwitch采集 Optics communications, 2005, 卷号: 256, 期号: 1-3, 页码: 68-72 作者:  Chen, SW;  Yan, QF;  Xu, QY;  Fan, ZC;  Liu, JW 收藏  |  浏览/下载：20/0  |  提交时间：2019/05/12 Optical waveguide  Propagation loss  Multiple reflections  Reflectometer   The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer (EI CONFERENCE) 会议论文  OAI收割 ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China Wu X.; Lei F.; Yatagai T. 收藏  |  浏览/下载：18/0  |  提交时间：2013/03/25 We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film  the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change  the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.