中国科学院机构知识库网格系统: 检索

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	Quantitative Characterization Method for Rock Surface Roughness with Different Scale Fluctuation 期刊论文 OAI收割 KSCE JOURNAL OF CIVIL ENGINEERING, 2022, 页码: 17 作者: Guo, Yuhang; Zhang, Chuanqing; Xiang, Hang; Cui, Guojian; Meng, Fanzhen \| 收藏 \| 浏览/下载：56/0 \| 提交时间：2022/04/11 Structural surface Roughness Quantitative characterization Power spectral density Statistical parameters
	基于功率谱密度的评估岩石节理粗糙度新方法期刊论文 OAI收割岩土力学, 2022, 卷号: 43, 期号: 11, 页码: 3135 作者: 张传庆; 郭宇航; 徐金顺; 刘宁; 谢起明 \| 收藏 \| 浏览/下载：7/0 \| 提交时间：2025/06/27 structural plane roughness characterization power spectral density curvature 岩体结构面粗糙度表征功率谱密度曲率
	Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文 OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者: Chen B.; Chen B. 收藏 \| 浏览/下载：35/0 \| 提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method Order perturbation theory (FOPT) is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree as the x-ray wavelength is 0.154 nm have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison the root mean square (RMS) surface roughness grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.
	ELECTRONIC STATES IN QUANTUM-WELLS WITH INTERFACE DEFECTS 期刊论文 OAI收割 Communications in Theoretical Physics, 1991, 卷号: 16, 期号: 3, 页码: 281-288 H. Sun; X. Zhang; S. W. Gu 收藏 \| 浏览/下载：34/0 \| 提交时间：2012/04/14 optical characterization roughness disorder growth