机构

• 金属研究所 [2]
• 武汉岩土力学研究所 [2]
• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [5]

内容类型

• 期刊论文 [4]
• 会议论文 [1]

发表日期

• 2024 [1]
• 2022 [2]
• 2011 [1]
• 1991 [1]

学科主题

筛选

浏览/检索结果: 共5条，第1-5条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择作者升序作者降序发表日期升序发表日期降序题名升序题名降序提交时间升序提交时间降序 Effect of liquid droplet impingement on electrochemical passivation behavior of 321 stainless steel in 0.5 wt% NaCl solution 期刊论文  OAI收割 JOURNAL OF MATERIALS RESEARCH AND TECHNOLOGY-JMR&T, 2024, 卷号: 33, 页码: 7795-7807 作者:  Du, Shuangyu;  Cui, Yu;  Liu, Rui;  Xue, Weihai;  Wang, Fuhui   |  收藏  |  浏览/下载：1/0  |  提交时间：2025/04/27 Liquid droplet impingement  Residual compressive stress  Surface roughness  Passive film  Electronic characterization   Quantitative Characterization Method for Rock Surface Roughness with Different Scale Fluctuation 期刊论文  OAI收割 KSCE JOURNAL OF CIVIL ENGINEERING, 2022, 页码: 17 作者:  Guo, Yuhang;  Zhang, Chuanqing;  Xiang, Hang;  Cui, Guojian;  Meng, Fanzhen   |  收藏  |  浏览/下载：79/0  |  提交时间：2022/04/11 Structural surface  Roughness  Quantitative characterization  Power spectral density  Statistical parameters   基于功率谱密度的评估岩石节理粗糙度新方法 期刊论文  OAI收割 岩土力学, 2022, 卷号: 43, 期号: 11, 页码: 3135 作者:  张传庆;  郭宇航   |  收藏  |  浏览/下载：20/0  |  提交时间：2025/06/27 structural plane  roughness characterization  power spectral density  curvature  岩体结构面  粗糙度表征  功率谱密度  曲率   Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：46/0  |  提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.   ELECTRONIC STATES IN QUANTUM-WELLS WITH INTERFACE DEFECTS 期刊论文  OAI收割 Communications in Theoretical Physics, 1991, 卷号: 16, 期号: 3, 页码: 281-288 H. Sun; X. Zhang; S. W. Gu 收藏  |  浏览/下载：44/0  |  提交时间：2012/04/14 optical characterization  roughness  disorder  growth