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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
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宁波材料技术与工程研... [5]
新疆理化技术研究所 [5]
光电技术研究所 [3]
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上海光学精密机械研究... [2]
上海硅酸盐研究所 [2]
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OAI收割 [23]
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期刊论文 [21]
会议论文 [2]
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2021 [1]
2019 [1]
2018 [2]
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Chemistry [2]
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Modified snapshot spectroscopic ellipsometry based on optical frequency-domain interferometry
期刊论文
OAI收割
Optik, 2021, 卷号: 228
作者:
Li, Siyuan
;
Zhang, Chunmin
;
Quan, Naicheng
  |  
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2021/01/21
Spectroscopic ellipsometry
Optical frequency-domain interferometry
Channel bandwidth
Study of the phase transition properties and electronic band structures of VO2 thin films grown on different substrates
期刊论文
OAI收割
MATERIALS RESEARCH EXPRESS, 2019, 卷号: 6, 期号: 2
作者:
Guo, Yunfeng
;
Zhang, Yuzhi
;
Zhang, Liangmiao
;
Lv, Xinrui
;
Wu, Lingnan
  |  
收藏
  |  
浏览/下载:72/0
  |  
提交时间:2019/12/31
VO2
metal-to-insulator transition
spectroscopic ellipsometry
electronic structure
A comparative study of primary and secondary passive films formed on AM355 stainless steel in 0.1 M NaOH
期刊论文
OAI收割
APPLIED SURFACE SCIENCE, 2018, 卷号: 427, 页码: 763-773
作者:
Man, Cheng
;
Dong, Chaofang
;
Cui, Zhongyu
;
Xiao, Kui
;
Yu, Qiang
  |  
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2018/12/04
Transpassive Dissolution Mechanism
Time Spectroscopic Ellipsometry
Electrochemical-behavior
Oxide Layer
Growth
304-stainless-steel
Chloride
Water
Acid
Iron
A comparative study of primary and secondary passive films formed on AM355 stainless steel in 0.1 M NaOH
期刊论文
OAI收割
APPLIED SURFACE SCIENCE, 2018, 卷号: 427, 页码: 763-773
作者:
Man, Cheng
;
Dong, Chaofang
;
Cui, Zhongyu
;
Xiao, Kui
;
Yu, Qiang
  |  
收藏
  |  
浏览/下载:40/0
  |  
提交时间:2018/12/04
Transpassive Dissolution Mechanism
Time Spectroscopic Ellipsometry
Electrochemical-behavior
Oxide Layer
Growth
304-stainless-steel
Chloride
Water
Acid
Iron
Effect of Ar/O2 ratio on structure and cationic distribution of Mn1.56Co0.96Ni0.48O4 +/-delta spinel films
期刊论文
OAI收割
APPLIED SURFACE SCIENCE, 2017, 卷号: 405, 期号: 5, 页码: 47-51
作者:
Shi, Q (Shi, Qin)
;
Ren, W (Ren, Wei)
;
Zhang, XB (Zhang, Xiaobo)
;
Kong, WW (Kong, Wenwen)
;
Gao, B (Gao, Bo)
收藏
  |  
浏览/下载:53/0
  |  
提交时间:2017/08/24
Thermistor thin film
XPS
Spectroscopic ellipsometry
O-2 partial pressure
Interband electronic transitions and phase diagram of PbZr1-xTixO3 (0.05 <= x <= 0.70) ceramics: ellipsometric experiment and first-principles theory
期刊论文
OAI收割
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2016, 卷号: 49, 期号: 27
作者:
Li, M. J.
;
Xu, L. P.
;
Shi, K.
;
Zhang, J. Z.
;
Chen, X. F.
收藏
  |  
浏览/下载:27/0
  |  
提交时间:2017/02/24
electronic transitions
spectroscopic ellipsometry
first-principles calculations
phase diagram
Optical Character of Barium Titanate Based Thin Films around the Phase Transition
期刊论文
OAI收割
FERROELECTRICS, 2016, 卷号: 491, 期号: 1, 页码: 8-14
作者:
Wang, HG (Wang, Hongguang)
;
Xu, JB (Xu, Jinbao)
;
Zhao, PJ (Zhao, Pengjun)
;
Ma, C (Ma, Chao)
;
Wang, L (Wang, Lei)
收藏
  |  
浏览/下载:36/0
  |  
提交时间:2016/03/23
Spin coating
spectroscopic ellipsometry
refractive index
Infrared optical properties of ferroelectric 0.5BaZr(0.2)Ti(0.8)O(3)-0.5Ba(0.7)Ca(0.3)TiO(3) thin films
期刊论文
OAI收割
CERAMICS INTERNATIONAL, 2015, 卷号: 41, 期号: 1, 页码: 475-480
作者:
Wang, HG (Wang, Hongguang)
;
Xu, JB (Xu, Jinbao)
;
Ma, C (Ma, Chao)
;
Zhao, PJ (Zhao, Pengjun)
;
Wang, L (Wang, Lei)
收藏
  |  
浏览/下载:23/0
  |  
提交时间:2015/03/11
Ferroelectric
Infrared spectroscopic ellipsometry
Refractive index
Extinction coefficient
Spectroscopic ellipsometry study of 0.5BaZr(0.2)Ti(0.8)O(3)-0.5Ba(0.7)Ca(0.3)TiO(3) ferroelectric thin films
期刊论文
OAI收割
Journal of Alloys and Compounds, 2014, 卷号: 615, 期号: 12, 页码: 526-530
作者:
Wang, Hongguang
;
Xu, Jinbao
;
Ma, Chao
;
Xu, Fanglong
;
Wang, Lei
收藏
  |  
浏览/下载:31/0
  |  
提交时间:2014/11/11
Ferroelectric
Sol-gel technique
Spectroscopic ellipsometry
Refractive index
Extinction coefficient
Temperature dependence of Mn1.56Co0.96Ni0.48O4 thin films optical properties by spectroscopic ellipsometry
期刊论文
OAI收割
Materials Letters, 2014, 卷号: 136, 期号: 12, 页码: 225-228
作者:
Ma, Chao
;
Wang, Hong Guang
;
Zhao, Peng Jun
;
Xu, Jin Bao
;
Chang, Ai Min
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2014/11/11
Thin films
Spectroscopic ellipsometry
Temperature dependence
Mechanism