机构

• 南京天文光学技术研究... [2]
• 长春光学精密机械与物... [1]
• 福建物质结构研究所 [1]

采集方式

• OAI收割 [4]

内容类型

• 会议论文 [3]
• 期刊论文 [1]

发表日期

• 2011 [1]
• 2010 [1]
• 2008 [2]

学科主题

• 天文技术与方法::系... [2]

筛选

浏览/检索结果: 共4条，第1-4条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Design and test of a high-contrast imaging coronagraph based on two 50-step transmission filters 会议论文  OAI收割 Beijing, China, 2011-11-6 作者:  Jiangpei Dou;  Yongtian Zhu;  Xi Zhang;  Deqing Ren;  Xue Wang 收藏  |  浏览/下载：31/0  |  提交时间：2014/01/07 Earth-like exoplanets  high-contrast imaging  coronagraphy  step-transmission filter  space telescopes   Testing of a transmission-filter coronagraph for ground-based imaging of exoplanets 会议论文  OAI收割 San Diego, California, USA, 2010-6-27 作者:  Jiangpei Dou;  Yongtian Zhu;  Xi Zhang;  Deqing Ren;  Xue Wang 收藏  |  浏览/下载：31/0  |  提交时间：2014/01/06 extra-solar planets  hot Jupiters  high-contrast imaging  coronagraphy  step-transmission filter  ground-based telescopes   A new ultraviolet filter: Rb2Ni (SO4)(2) center dot 6H(2)O (RNSH) single crystal 期刊论文  OAI收割 Optical Materials, 2008, 卷号: 31, 期号: 2, 页码: 233-236 X. Wang; X. X. Zhuang; G. B. Su and Y. P. He 收藏  |  浏览/下载：83/0  |  提交时间：2013/01/22 Ultraviolet filter  Crystal structure  Elementary step  Thermal  stability  Transmission spectrum  nickel sulfate hexahydrate  growth   Optical characteristic of ion beam sputter deposited aluminum thin films (EI CONFERENCE) 会议论文  OAI收割 International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings, September 9, 2007 - September 12, 2007, Beijing, China 作者:  Yang H.;  Liu L.;  Liu L. 收藏  |  浏览/下载：28/0  |  提交时间：2013/03/25 Aluminum is a typical active metal very easy to oxidize. An oxide surface layer of about 2-6nm quickly formed in air which adds difficulty to the optical constants determination. An ex-situ method is used to determine the optical constants of aluminum thin films. First  Second  Third  alumina (Al2O3) thin film is deposited by ion beam sputter deposition. The optical constants and thickness are determined by spectral ellipsoemtry (SE). The thickness is verified by grazing x-ray reflection (GXRR) fitting method  Al thin film with an Al2O3 cap layer on top is deposited. This cap layer is of the same deposition condition with the first step. By fitting the GXRR spectra  based on the acquired structure information  the structure information (the thickness of the aluminum and the cap layer  the ellipsometric spectra are fitted. The optical constants of the aluminum layer are extracted with the aid of the Drude model. Finally  surface roughness and the diffusion between Al-Al2O 3) is obtained  an induced transmission filter (ITF) is designed and deposited.