机构

• 长春光学精密机械与物... [1]

采集方式

• OAI收割 [1]

内容类型

• 会议论文 [1]

发表日期

• 2006 [1]

学科主题

筛选

浏览/检索结果: 共1条，第1-1条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Analysis of a precise instrument for measuring reference level involute (EI CONFERENCE) 会议论文  OAI收割 Third International Symposium on Precision Mechanical Measurements, August 2, 2006 - August 6, 2006, Xinjiang, China 作者:  Zhang Y.;  Wang X.;  Wang X.;  Wang X.;  Wang L. 收藏  |  浏览/下载：31/0  |  提交时间：2013/03/25 Reference level involute is used for evaluating other involutes  but it is very difficult to measure reference level involute exactly. Nowadays the available methods for measuring precise involute include single base disc mode  electronic generation mode  and CNC three-coordinate mode. But measurement accuracy of the modes above is not suitable for reference level involute. A precise instrument for measuring reference level involute  double base discs instrument  is introduced. It is consistent with generation principle of the involute entirely. Besides having the advantages of single basic disc instrument  the instrument can remove Abbe error caused by the stylus  and has no pressure deforming. The instrument's structure is described. The main sources of measurement errors are analyzed and methods for compensation are presented. Finally  uncertainty of the instrument is given  which meets reference level involute test specification.