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CAS IR Grid
机构
长春光学精密机械与物... [2]
沈阳自动化研究所 [1]
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OAI收割 [3]
内容类型
会议论文 [2]
期刊论文 [1]
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2016 [1]
2010 [1]
2009 [1]
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NURBS curve interpolation algorithm based on tool radius compensation method
期刊论文
OAI收割
International Journal of Production Research, 2016, 卷号: 54, 期号: 15, 页码: 4448-4474
作者:
Zhou B(周波)
;
Zhao JB(赵吉宾)
;
Li L(李论)
;
Xia RB(夏仁波)
收藏
  |  
浏览/下载:41/0
  |  
提交时间:2015/08/24
tool radius compensation
continuous short block
NURBS fitting
look ahead
acceleration/deceleration feedrate-planning
SSA based decomposition of tool position trajectory for diamond turning of freeform optical surfaces (EI CONFERENCE)
会议论文
OAI收割
2009 International Conference on Manufacturing Science and Engineering, ICMSE 2009, December 26, 2009 - December 28, 2009, Zhuhai, China
作者:
Liu Q.
;
Lin C.
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  |  
浏览/下载:21/0
  |  
提交时间:2013/03/25
The radial spiral feed of the tool and the tool nose radius compensation are taken into consideration for the tool position trajectory (TPT) generation in diamond turning of freeform optical surfaces. Using the coarse sampling and the fine interpolation
a novel approach based on singular spectrum analysis (SSA) is presented to decompose the generated TPT into a slowly varying trend and a quickly varying quasi-periodic oscillation. The numerical experiments of the TPT decomposition of toroidal surfaces have been carried out. The results verify that the proposed approach is very effective for the TPT decomposition. (2010) Trans Tech Publications.
Machining and testing technology research of industrial aspherical components (EI CONFERENCE)
会议论文
OAI收割
2009 IEEE International Conference on Mechatronics and Automation, ICMA 2009, August 9, 2009 - August 12, 2009, Changchun, China
作者:
Zhang X.
;
Yu H.
;
Zhang X.
;
Zhang X.
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  |  
浏览/下载:19/0
  |  
提交时间:2013/03/25
Aspherical optical elements are widely used in modern optic system design. The tool model and workpiece deformation are established
and the tool radius error compensation is discussed . The aspherical optical elements are processed on a precision milling machine
and tested on a measuring instrument. 2009 IEEE.