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Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
高能物理研究所 [5]
长春光学精密机械与物... [3]
上海应用物理研究所 [1]
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OAI收割 [9]
内容类型
期刊论文 [5]
会议论文 [3]
学位论文 [1]
发表日期
2013 [1]
2009 [1]
2008 [3]
2007 [1]
2006 [3]
学科主题
Physics [3]
核技术及应用 [1]
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Study on application of independent component analysis in the CSNS/RCS
期刊论文
OAI收割
Chinese Physics C, Chinese Physics C, 2013, 2013, 期号: 3, 页码: 106-111, 106-111
作者:
An YW(安宇文)
;
Wang S(王生)
  |  
收藏
  |  
浏览/下载:29/0
  |  
提交时间:2015/12/14
independent component analysis
turn-by-turn BPM
RF kicker
independent component analysis
turn-by-turn BPM
RF kicker
Preliminary application of turn-by-turn data analysis to the SSRF storage ring
期刊论文
OAI收割
CHINESE PHYSICS C, 2009, 卷号: 33, 期号: 7, 页码: 4
Chen, JH(陈建辉)
;
Zhao, ZT(赵振堂)
收藏
  |  
浏览/下载:34/0
  |  
提交时间:2012/04/11
beam position monitor
turn-by-turn
model independent analysis
principal component analysis
independent component analysis
博士论文-FMA在环形加速器动力学分析中的应用
学位论文
OAI收割
博士, 北京: 中国科学院研究生院, 2008
作者:
焦毅
收藏
  |  
浏览/下载:80/0
  |  
提交时间:2015/10/12
FMA
动力学孔径
Lie代数
超周期结构共振
纵向横向耦合共振
turn-by-turn实验
Preliminary study of residual orbit oscillation in BEPCII
期刊论文
OAI收割
CHINESE PHYSICS C, 2008, 卷号: 32, 期号: 10, 页码: 849-851
作者:
Ma HZ(麻惠洲)
;
Xu G(徐刚)
;
Lei G(雷革)
;
Cao JS(曹建社)
;
Ma L(马力)
收藏
  |  
浏览/下载:30/0
  |  
提交时间:2016/06/28
local orbit bump
residual orbit oscillation
Librea Electron BPM processor
turn-by-turn
Preliminary study of residual orbit oscillation in BEPCII
期刊论文
OAI收割
中国物理C, 中国物理C, 2008, 2008, 期号: 10, 页码: 849-851, 849-851
作者:
Ma HZ(麻惠洲)
;
Xu G(徐刚)
;
Lei G(雷革)
;
Cao JS(曹建社)
;
Ma L(马力)
  |  
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2015/12/14
local orbit bump
residual orbit oscillation
Librea Electron BPM processor
turn-by-turn
local orbit bump
residual orbit oscillation
Librea Electron BPM processor
turn-by-turn
Mid-frequency surface error test with a Foucault apparatus (EI CONFERENCE)
会议论文
OAI收割
3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, July 8, 2007 - July 12, 2007, Chengdu, China
作者:
Li J.
;
Li J.
;
Xuan B.
;
Li J.
收藏
  |  
浏览/下载:22/0
  |  
提交时间:2013/03/25
Testing of mid-frequency surface error is of the first importance for fast optics
especially for large aperture aspherics. Foucault test plays a dominant role for surface error inspection before the digital interferometer age
but it seems to have faded out these days because no quantitative results turn out. However
an interferometer with high resolution CCDs is either unavailable or unaccessible in the process of manufacture. As its advantages are realized and recognized for the second time
Foucault test is going back to the stage again. A new theory of calculating the contrast of the shadow pattern of Foucault test is put forward in this paper and some modifications are discussed upon the analyses of the limitation of traditional Foucault apparatus. A paraboloidal mirror was fabricated and tested by the modified Foucault apparatus whose effect has been proved to be great. The methods of controlling mid-frequency error are described in the other paper at this conference- "Multi-mode combine manufacturing technology for large aperture aspheric mirrors"1.
Field emission properties of ZnO nanowires (EI CONFERENCE)
会议论文
OAI收割
ICO20: Display Devices and Systems, August 21, 2005 - August 26, 2005, Changchun, China
Meng X. Q.
;
Shen D. Z.
;
Zhang J. Y.
;
Zhao D. X.
;
Lu Y. M.
;
Zhang Z. Z.
;
Fan X. W.
收藏
  |  
浏览/下载:26/0
  |  
提交时间:2013/03/25
ZnO nanowires were obtained by using a simple vapor solid process. The length of the nanowires is about 1 m
with diameters ranging from 40 nm to 150 nm. X-ray diffraction (XRD) pattern confirms the nanowires are wurtzite structure with c-axis preferred orientation. Photoluminescence (PL) measurement shows a strong UV emission and a weak visible emission. Field emission (FE) results proved the nanowires have low turn-on voltage and high field enhancement factor
which indicates ZnO nanowire is a suitable candidate for field emission display.
Method for the fabrication of isometric mesh on the concave of a spherical substrate (EI CONFERENCE)
会议论文
OAI收割
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Advanced Optical Manufacturing and Testing Technologies, November 2, 2005 - November 5, 2005, Xian, China
作者:
Feng X.-G.
收藏
  |  
浏览/下载:35/0
  |  
提交时间:2013/03/25
Metallic mesh has been widely used in electromagnetic interference windows. While the duty ratio of curved mesh equals to planar mesh'
the theory of planar mesh may be applied to curved mesh according to equivalent-circuit model. So the idea that latitude lines intersect latitude lines to form isometric mesh on the concave of a sphere is put forward
and the method of fabricating the mesh by concentric optical scan is introduced. The movement parts of equipment consist of an erection turning
a horizontal dividing and a pitching dividing spindle. Firstly
a spherical substrate is fixed on the horizontal dividing spindle that has been set horizontally on the erect turning spindle
the substrate revolves around the axis of the erect spindle
the tube of object lens that is fixed on the pitching dividing spindle steps at pitching direction
and a revolving circuit of the substrate corresponds to a step of the tube. Gradually
a set of latitude lines is attained. Afterward
the substrate makes a quarter turn around the horizontal spindle
another orientation latitude lines are also gained. Thus
the isometric mesh on the concave of a spherical substrate is gained. The process comprises surface cleaning
coating photoresist
laser direct writing
development
evaporated film
dissolving photoresist and plating. The fabricated spherical mesh has a line width of 7 m and a period of 600m. Experiment shows that infrared transmission and electromagnetism shield efficiency of the metallic mesh are relatively consistent with theoretical value.
Application of the turn-by-turn beam position measurements on BEPC storage ring
期刊论文
OAI收割
HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION, 2006, 卷号: 30, 期号: 10, 页码: 1018-1021
作者:
Jiao Y(焦毅)
;
Zhang L(张磊)
;
Wang JQ(王九庆)
;
Yue JH(岳军会)
;
Cao JS(曹建社)
收藏
  |  
浏览/下载:25/0
  |  
提交时间:2016/06/29
turn-by-turn position measurement
NAFF method
resonance