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	Microscopic Machine Vision Based Degradation Monitoring of Low-Voltage Electromagnetic Coil Insulation Using Ensemble Learning in a Membrane Computing Framework 期刊论文 OAI收割 IEEE ACCESS, 2019, 卷号: 7, 页码: 97216-97241 作者: Jiang T(蒋涛); Li C(李晨); Kong FJ(孔樊杰); Wang K(王锴); Xu AD(徐皑冬) \| 收藏 \| 浏览/下载：55/0 \| 提交时间：2019/08/29 Low-voltage electromagnetic coil insulation degradation monitoring ensemble learning machine vision membrane computing microscopic image analysis feature extraction
	Degradation Monitoring of Low-voltage Electromagnetic Coil Insulation Based on Microscopic Image Analysis 会议论文 OAI收割 Chongqing, China, October 26-28, 2018 作者: Kong FJ(孔樊杰); Wang K(王锴); Qi SL(齐守良); Guo HF(郭海丰); Xu AD(徐皑冬) \| 收藏 \| 浏览/下载：48/0 \| 提交时间：2018/12/25 low-voltage electromagnetic coil insulation degradation monitoring microscopic image analysis
	Enhanced durability of sulfonated poly (ether ether ketones)-based polymer electrolyte membranes by a multi-layer composite technology 期刊论文 OAI收割 SOLID STATE IONICS, 2017, 卷号: 309, 页码: 33-40 作者: Jiang, Yongyi; Hou, Ming; Hao, Jinkai; Yi, Baolian; Wang, Zhen 收藏 \| 浏览/下载：39/0 \| 提交时间：2017/12/20 Multi-layer composite membrane Transition layer Chemical degradation Accelerated open circuit voltage tests Durability
	Enhanced durability of sulfonated poly (ether ether ketones)-based polymer electrolyte membranes by a multi-layer composite technology 期刊论文 OAI收割 SOLID STATE IONICS, 2017, 卷号: 309, 页码: 33-40 作者: Jiang, Yongyi; Hou, Ming; Hao, Jinkai; Yi, Baolian; Wang, Zhen 收藏 \| 浏览/下载：44/0 \| 提交时间：2017/12/20 Multi-layer composite membrane Transition layer Chemical degradation Accelerated open circuit voltage tests Durability
	Effects of reverse voltage and subzero startup on the membrane electrode assembly of a PEMFC 期刊论文 OAI收割 journal of power sources, 2007, 卷号: 165, 期号: 1, 页码: 287-292 作者: Wang, Hongwei; Hou, Junbo; Yu, Hongmei; Sun, Shucheng 收藏 \| 浏览/下载：30/0 \| 提交时间：2010/11/30 degradation reverse voltage MEA hydrogen pump PEMFC
	The effect of N/Si ratio on the a-SiiH/SiNx interface of a-SirH/SiNx TFT (EI CONFERENCE) 会议论文 OAI收割 Asia Display 2007, AD'07, March 12, 2007 - March 16, 2007, Shanghai, China Liu J. e.; Gao W.; Liao Y.; Jing H.; Fu G. 收藏 \| 浏览/下载：29/0 \| 提交时间：2013/03/25 The threshold voltage of a-Si: H/SiNx TFT will shift under long time gate bias stress it is mostly leaded by charge trapping in gate insulator and defect creation in semiconductor. And it is hard to be applied in AMOLED for TFT because of its threshold voltage shift. In allusion to the phenomenon of charge trapping a series of SiNx insulating films in different N/Si(0. 87 -1.68) ratio were deposited by PECVD in this paper controlling different flow ratio of source gas SiH4 and NH3 and a great deal of tests (ellipsometer infrared absorption (FTIR) and Electron Dispersion Spectrum (EDS) test ) were done on these samples. Based on these SiNx insulators three different capacitance samples in MIS structure were done degraded experiments and C-V tests on these samples were done. The C-V curve shift of capacitance which contained SiNx with slightly N-rich(N/Si is bigger slightly than 1. 33) was not evident before and after degradation this result indicated that the defect density of this type SiN x was smaller and could restrain charge chapping in the interface of a-Si:H/SiNx effectively. So that as gate insulator of TFT SiN x with slightly N-rich could decrease the threshold voltage shift of TFT and enhance its stability effectively.
	500h continuous aging life test on PBI/H3PO4 high-temperature PEMFC 期刊论文 OAI收割 international journal of hydrogen energy, 2006, 卷号: 31, 期号: 13, 页码: 1855-1862 作者: Hu, Jingwei; Zhang, Huamin; Zhai, Yunfeng; Liu, Gang; Yi, Baolian 收藏 \| 浏览/下载：41/0 \| 提交时间：2015/11/11 high-temperature PEMFC PBI/H3PO4 voltage degradation internal resistance performance degradation
	Dose rate dependence of electrical characteristics of lead zirconate titanate capacitors 期刊论文 OAI收割 japanese journal of applied physics part 1-regular papers short notes & review papers, 2003, 卷号: 42, 期号: 10, 页码: 6491-6495 Zhang GQ; Sun P; Zou Q; Mei X; Ruda HE; Gu Q; Yu XF; Ren DY; Yan RL 收藏 \| 浏览/下载：1286/12 \| 提交时间：2010/08/12 ionizing radiation dose rate PZT dielectric constant coercive field C-V curves remanent polarization FERROELECTRIC PZT CAPACITORS IONIZING-RADIATION BORDER TRAPS TRANSISTORS DEGRADATION MECHANISMS MEMORIES VOLTAGE DEVICES RAY