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	LKZ-1: A New Zircon Working Standard for the In Situ Determination of U-Pb Age, O-Hf Isotopes, and Trace Element Composition 期刊论文 OAI收割 MINERALS, 2019, 卷号: 9, 期号: 5, 页码: 16 作者: Cheong, Albert Chang-sik; Jeong, Youn-Joong; Lee, Shinae; Yi, Keewook; Jo, Hui Je \| 收藏 \| 浏览/下载：69/0 \| 提交时间：2019/09/09 zircon working standard LKZ-1 U-Pb age O isotopes Hf isotopes trace element
	Design of multispectral remote sensing image compression system (EI CONFERENCE) 会议论文 OAI收割 2010 International Conference on Computer Application and System Modeling, ICCASM 2010, October 22, 2010 - October 24, 2010, Shanxi, Taiyuan, China 作者: Xu S.-Y. 收藏 \| 浏览/下载：23/0 \| 提交时间：2013/03/25 In order to get the higher compression quality of multispectral remote sensing image which taken the JPEG2000 as the standard used FPGA and special compression chip ADV212 to realize the remote sensing image compression system is proposed. The system used the specialty compression chip ADV212 which is newly relaesed by Analog Device company. It used to develop fast high-quality compression for the large amount of remote sensing image data. The system realized the image data's input the compression stream's output the image preprocessing as well as to control the ADV212 chip's working pattern through FPGA. The experiment result shows that this system which has such characteristics as low power consumption. low cost and easy adjustmen and has a good compressing effect. Meet the requirement of the multispectral remote sensing image's high compression ratio. 2010 IEEE.
	In situ long trace profiler for measurement of Wolter type-I mirror (EI CONFERENCE) 会议论文 OAI收割 Advances in Metrology for X-Ray and EUV Optics III, August 1, 2010 - August 2, 2010, San Diego, CA, United states 作者: Chen B.; Chen B. 收藏 \| 浏览/下载：31/0 \| 提交时间：2013/03/25 The surface profile of Wolter type-I mirror has a great impact on the performance of Solar X-ray Telescope. According to the existing fabrication instrument and experimental conditions in our lab an in situ Long Trace Profiler is developed and set up on the fabrication instrument in order to measure the surface profile of Wolter mirror in real time during fabrication process. Its working mechanism structural parameters and data processing algorithm are investigated. The prototype calibrated by a standard plane mirror is used to measure a sample of Wolter type-I mirror. The results show that our prototype can achieve an accuracy of 2.6rad rms for slope error with a stability of 1.33rad during the whole measurement period. This can meet further fabrication requirements. 2010 Copyright SPIE - The International Society for Optical Engineering.
	Dynamic evaluation system for interpolation errors in the encoder of high precision (EI CONFERENCE) 会议论文 OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China 作者: Liang L.-H.; Sun Y.; Sun Y.; Wan Q.-H. 收藏 \| 浏览/下载：35/0 \| 提交时间：2013/03/25 In order to measure dynamic interpolation errors of photoelectric encoder of high precision the dynamic evaluation system of interpolation errors is introduced. Firstly the fine Moire signal of encoder which is collected with the high-speed data gathering card into the computer is treated to equiangular data with the method of linear interpolation. Then the analysis of harmonic wave with the FFT is processed. Compared with the standard signal the dynamic interpolation errors of the encoder are calculated. Experimental results show that the precision of the dynamic evaluation system of interpolation errors is 0.1 %( pitch). The evaluation system is simple fast high precision and can be used in the working field of the encoder. 2009 SPIE.
	Study on chromaticity balance for LED exposure system (EI CONFERENCE) 会议论文 OAI收割 International Symposium on Photoelectronic Detection and Imaging 2007 - Laser, Ultraviolet, and Terahertz Technology, September 9, 2007 - September 12, 2007, Beijing, China 作者: Meng Z.; Meng Z. 收藏 \| 浏览/下载：21/0 \| 提交时间：2013/03/25 A standard white light compounding algorithm based on combination of CCD illumination acquisition with computer control is presented for LEDs. The computer adjust and control the working current of LEDs by using three-color LEDs illumination acquired by CCD camera achieved chromaticity coordinates error between compounded white light and standard white light D65 less than the threshold beforehand setted by this technique then acquiring needed standard white light. Compounded white light meet the chromaticity error demand that is able to be changed at the same time the CCD illumination acquisition system is eliminated. The proposed algorithm improved the light energy utilization efficiency of LED and eliminated the offset of central wavelength and chromaticity coordinates due to work current change of LEDs. Experimental results show that the proposed algorithm achieved lesser chromaticity error uv=0.001 relative to standard white light D65 enhanced chromaticity uniformity of illumination field.
	Study on chroma balance based on grating spectrometer for LED (EI CONFERENCE) 会议论文 OAI收割 Light-Emitting Diode Materials and Devices II, November 12, 2007 - November 14, 2007, Beijing, China 作者: Meng Z.; Meng Z. 收藏 \| 浏览/下载：25/0 \| 提交时间：2013/03/25 A standard white light compounding algorithm based on combination of choma coordinates acquisition system with computer working current control system is presented for three-color LED. The chroma coordinates acquisition system consist of grating spectrometer and integrating sphere. The computer adjust and control the working current of three-color LED then achieved chroma coordinates error between the compounded white light and standard white light D65 until the chroma coordinates is less than the threshold beforehand set by this technique. The compounded white light meet the chroma error demanded that is able to be changed at the same time the chroma coordinates acquisition system and the working current control system are eliminated. The proposed algorithm the offset of central wavelength and the change of chroma coordinates due to working current variety for LEDs. Experimental results show that the proposed algorithm achieved lesser chroma error uv=0.001 relative to standard white light D65 enhanced chroma uniformity of illumination field.