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浏览/检索结果: 共23条，第1-10条 帮助 条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Multilayer Graphene: A Potential Anti-oxidation Barrier in Simulated Primary Water 期刊论文  OAI收割 Journal of Materials Science & Technology, 2014, 卷号: 30, 期号: 11, 页码: 1084-1087 H. L. Ming; J. Q. Wang; Z. M. Zhang; S. Y. Wang; E. H. Han; W. Ke 收藏  |  浏览/下载：25/0  |  提交时间：2015/01/14 Graphene  Raman spectroscopy  X-ray photoelectron spectroscopy  Anti-oxidation barrier  Simulated primary water  few-layer graphene  chemical-vapor-deposition  corrosion protection  copper foils  organic coatings  large-area  part 1  films  spectroscopy  surface   Electronically Nonalloyed State of a Statistical Single Atomic Layer Semiconductor Alloy 期刊论文  OAI收割 NANO LETTERS, 2012, 卷号: 12, 期号: 11, 页码: 5845 Ebert, P; Landrock, S; Jiang, Y; Wu, KH; Wang, EG; Dunin-Borkowski, RE 收藏  |  浏览/下载：28/0  |  提交时间：2013/09/17 TUNNELING SPECTROSCOPY  SI(111)2X1 SURFACE  OVERLAYERS   Roughness analysis of optical surfaces by X-ray scattering (EI CONFERENCE) 会议论文  OAI收割 2011 International Conference on Electronics and Optoelectronics, ICEOE 2011, July 29, 2011 - July 31, 2011, Dalian, China 作者:  Chen B.;  Chen B. 收藏  |  浏览/下载：25/0  |  提交时间：2013/03/25 A grazing incidence x-ray scattering (XRS) method  Order perturbation theory (FOPT)  is stated briefly and an experimental facility based on an improved X-ray diffraction has been introduced  which can work with high performance. The x-ray scattering distributions of two super smooth silicon samples measured at the incidence angle 0.2 degree  as the x-ray wavelength is 0.154 nm  have been given and analyzed by the FOPT to give information about the surface profiles. As a comparison  the root mean square (RMS) surface roughness  grey-scale maps and one-dimensional power spectral density (1D PSD) have been derived from the atomic-force microscope (AFM) data. The results evaluated by FOPT are in good agreement with that of AFM  which indicates that x-ray scattering method is a practical characterization for the investigation of super smooth surfaces. 2011 IEEE.   Assessment of surface roughness by use of soft x-ray scattering (EI CONFERENCE) 会议论文  OAI收割 Soft X-Ray Lasers and Applications VIII, August 4, 2009 - August 6, 2009, San Diego, CA, United states Yan-li M.; Yong-gang W.; Shu-yan C.; Bo C. 收藏  |  浏览/下载：29/0  |  提交时间：2013/03/25 A soft x-ray reflectometer with laser produced plasma source has been designed  which can work from wavelength 8nm to 30 nm and has high performance. Using the soft x-ray reflectometer above  the scattering light distribution of silicon and zerodur mirrors which have super-smooth surfaces could be measured at different incidence angle and different wavelength. The measurement when the incidence angle is 2 degree and the wavelength is 1 lnm has been given in this paper. A surface scattering theory of soft x-ray grazing incidence optics based on linear system theory and an inverse scattering mathematical model is introduced. The vector scattering theory of soft x-ray scattering also is stated in detail. The scattering data are analyzed by both the methods above respectively to give information about the surface profiles. On the other hand  both the two samples are measured by WYKO surface profiler  and the surface roughness of the silicon and zerodur mirror is 1.3 nm and 1.5nm respectively. The calculated results are in quantitative agreement with those measured by WYKO surface profiler  which indicates that soft x-ray scattering is a very useful tool for the evaluation of highly polished surfaces. But there still some difference among the results of different theory and WYKO  and the possible reasons of such difference have been discussed in detail. 2009 SPIE.   Density Functional Theory Study of HCN Adsorption on Small Gold Clusters 期刊论文  OAI收割 Chinese Journal of Structural Chemistry, 2009, 卷号: 28, 期号: 11, 页码: 1490-1496 B. Q. Guo, J. M. Hu, Y. Li, Y. F. Zhang and J. Q. Li 收藏  |  浏览/下载：25/0  |  提交时间：2012/11/06 density functional theory  adsorption  HCN  Au clusters  resolution infrared-spectroscopy  copper clusters  surface  pt(111)  hydrogenation  ni(111)  carbon  atoms  cn  w(100)-(5x1)-c   Theory of the excitation of the vibrational mode of an adatom-substrate system under a resonant laser field 期刊论文  OAI收割 PHYSICAL REVIEW B, 2008, 卷号: 78, 期号: 12 Ma, J; Wang, EG; Zhang, ZY; Wu, BA 收藏  |  浏览/下载：28/0  |  提交时间：2013/09/23 H STRETCHING MODES  SI(111)-H SURFACE  X-1) SURFACE  SI  ENERGY  HYDROGEN  RELAXATION  DESORPTION  MOLECULES  H/SI(111)   Density functional studies on the geometries and electronic structures for the adsorption of acetylene and ethylene molecules on Si(100) surface 期刊论文  OAI收割 Acta Chimica Sinica, 2007, 卷号: 65, 期号: 14, 页码: 1305-1312 G. P. Qin; Y. P. Cai; B. L. Xing; Y. Li; Y. F. Zhang; J. Q. Li 收藏  |  浏览/下载：26/0  |  提交时间：2013/04/01 density functional theory  Si(100) surface  ethylene  acetylene  band  structure  total-energy calculations  wave basis-set  first-principles  si(001)2x1  surface  room-temperature  hartree-fock  band-gaps  c2h2  chemistry  hydrogen   Adsorption of alkali metals on Ge(001)(2 x 1) surface 期刊论文  OAI收割 Chemical Physics Letters, 2006, 卷号: 417, 期号: 1-3, 页码: 41070 H. Y. Xiao; X. T. Zu; Y. F. Zhang; F. Gao 收藏  |  浏览/下载：29/0  |  提交时间：2012/04/14 double-layer model  ab-initio  covered si(100)  2x1-k surface  si(001)  states  cs  overlayer  oxidation  exchange   First principles calculations of adsorption and diffusion of Ba on a reconstructed Si(001) surface 期刊论文  OAI收割 Surface Review and Letters, 2006, 卷号: 13, 期号: 4, 页码: 365-368 Z. G. Wang; X. T. Zu 收藏  |  浏览/下载：16/0  |  提交时间：2012/04/14 first principles  Ba  Si(001) surface  adsorption  x-1 surface  exchange  phase  leed  wave   Atomic and electronic structures of rubidium adsorption on Si(001)(2 x 1) surface: Comparison with Cs/Si(001) surface 期刊论文  OAI收割 Chemical Physics, 2006, 卷号: 323, 期号: 2-3, 页码: 383-390 H. Y. Xiao; X. T. Zu; Y. F. Zhang; F. Gao 收藏  |  浏览/下载：30/0  |  提交时间：2012/04/14 first-principles calculations  rubidium  adsorption  silicon  adsorbed si(100) surfaces  angle-resolved photoemission  potassium  double-layer  x-ray-diffraction  photoelectron-spectroscopy  2x1-k  surface  cs  si(001)-(2x1)  overlayer  cesium