中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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  • 西安光学精密机械研究... [2]
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  • 2016 [2]
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Measurement of excited layer thickness in highly photo-excited GaAs 会议论文  OAI收割
international symposium on optical measurement technology and instrumentation, beijing, china, 2016-05-09
作者:  
Liang, Lingliang;  Tian, Jinshou;  Wang, Tao;  Wu, Shengli;  Li, Fuli
收藏  |  浏览/下载:21/0  |  提交时间:2017/01/17
Reflectivity and depth images based on time-correlated single photon counting technique 会议论文  OAI收割
international symposium on optical measurement technology and instrumentation, beijing, china, 2016-05-09
作者:  
Duan, Xuejie;  Ma, Lin;  Kang, Yan;  Zhang, Tongyi
收藏  |  浏览/下载:15/0  |  提交时间:2017/01/17