中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
机构
  • 上海微系统与信息技术... [1]
采集方式
内容类型
发表日期
学科主题
筛选

浏览/检索结果: 共1条,第1-1条 帮助

限定条件                
条数/页: 排序方式:
A novel approach to compare the charge buildup induced by Co-60 and X-ray radiation in SOI buried oxides 期刊论文  OAI收割
ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, 2007, p 257-259, 2007, 页码: 257-259
Tian, H. (State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences); Zhang, Zh.X.; Zhang, E.X.; He, W.; Yang, H.; Yu, W.J.; Wang, X
收藏  |  浏览/下载:7/0  |  提交时间:2012/06/13