中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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CAS IR Grid
机构
近代物理研究所 [8]
国家空间科学中心 [1]
半导体研究所 [1]
采集方式
OAI收割 [10]
内容类型
会议论文 [5]
期刊论文 [5]
发表日期
2000 [10]
学科主题
光电子学 [1]
空间环境 [1]
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浏览/检索结果:
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发表日期:2000
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Linear bunchers and half-frequency bunching method
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 卷号: 455, 期号: 12, 页码: 533-538
作者:
Tang, JY
;
Jiang, JZ
;
Shi, AM
;
Yin, ZK
;
Wang, YF
  |  
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2010/10/29
very low energy beam transfer
linear buncher
half-frequency bunching
high-voltage direct forming method
Modeling of damage creation in metallic materials under swift heavy ion irradiations
会议论文
OAI收割
作者:
Wang, ZG
;
Jin, YF
;
Hou, MD
;
Jin, GM
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2018/08/20
electronic energy loss
thermal spike
swift heavy ion irradiation
damage creation
metallic material
Modeling of damage creation in metallic materials under swift heavy ion irradiations
会议论文
OAI收割
作者:
Wang, ZG
;
Jin, YF
;
Hou, MD
;
Jin, GM
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2018/08/20
electronic energy loss
thermal spike
swift heavy ion irradiation
damage creation
metallic material
Modeling of damage creation in metallic materials under swift heavy ion irradiations
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 卷号: 169, 期号: 6, 页码: 98-105
作者:
Hou, MD
;
Jin, GM
;
Jin, YF
;
Wang, ZG
  |  
收藏
  |  
浏览/下载:6/0
  |  
提交时间:2010/10/29
electronic energy loss
thermal spike
swift heavy ion irradiation
damage creation
metallic material
Experimental studies of single-event effects induced by heavy ions
会议论文
OAI收割
作者:
Liu, J
;
Hou, MD
;
Li, BQ
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2018/08/20
single-event effect
heavy ion simulation
microcircuit
Experimental studies of single-event effects induced by heavy ions
会议论文
OAI收割
作者:
Liu, J
;
Hou, MD
;
Li, BQ
;
Liu, CL
;
Wang, ZG
  |  
收藏
  |  
浏览/下载:8/0
  |  
提交时间:2018/08/20
single-event effect
heavy ion simulation
microcircuit
Experimental studies of single-event effects induced by heavy ions
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 卷号: 164, 期号: 5, 页码: 973-978
作者:
Li, BQ
;
Guo, R
;
Sun, YQ
;
Mao, XM
;
Wu, W
  |  
收藏
  |  
浏览/下载:9/0
  |  
提交时间:2010/10/29
single-event effect
heavy ion simulation
microcircuit
Experimental studies of single-event effects induced by heavy ions
期刊论文
OAI收割
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2000, 卷号: 164, 页码: 973-978
作者:
Liu, J
;
Hou, MD
;
Li, BQ
;
Liu, CL
;
Wang, ZG
  |  
收藏
  |  
浏览/下载:7/0
  |  
提交时间:2011/08/26
single-event effect
heavy ion simulation
microcircuit
Experimental studies of single-event effects induced by heavy ions
会议论文
OAI收割
18th International Conference on Atomic Collisions in Solids (ICACS-18), Odense, Denmark, 1999
作者:
Liu, J.
;
Hou, M. D.
;
Li, B. Q.
;
Liu, C. L.
;
Wang, Z. G.
收藏
  |  
浏览/下载:12/0
  |  
提交时间:2014/04/30
Back-incident SiGe-Si multiple quantum-well resonant-cavity-enhanced photodetectors for 1.3-mu m operation
期刊论文
OAI收割
ieee photonics technology letters, 2000, 卷号: 12, 期号: 10, 页码: 1373-1375
Li C
;
Yang QQ
;
Wang HJ
;
Yu JZ
;
Wang QM
;
Li YK
;
Zhou JM
;
Huang H
;
Ren XM
收藏
  |  
浏览/下载:43/0
  |  
提交时间:2010/08/12
Bragg reflector
resonant-cavity-enhanced photodetector
responsivity
SiGe
PHOTODIODE
REFLECTORS
MIRRORS