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PIXE、ICP-AES和INAA在软玉微量元素分析中的应用 会议论文  OAI收割
全国矿物材料学术研讨会, 中国地质大学(武汉), 2009-12-09~2009-12-11
张朱武; 冯松林; 承焕生; 徐永春; 干福熹; 李青会
收藏  |  浏览/下载:1566/248  |  提交时间:2010/04/28
Comprehensive utilization of the red seaweed Gracilaria lemaneiformis 会议论文  OAI收割
13th international biotechnology symposium and exhibition, 中国, 2008-10-12
李海燕; 张卫
收藏  |  浏览/下载:16/0  |  提交时间:2011/07/11
Medium Optimization for the Production of Human Cytochrome P450 2C9 by Escherichia Coli BL21(DE3)pLysS using Plackett Burman Design and Grey Relational Analysis 会议论文  OAI收割
the 1st asia pacific issx meeting, 韩国, 2006-5-24
郝大程; 朱盼鸿; 杨胜利; 杨凌
收藏  |  浏览/下载:23/0  |  提交时间:2011/07/11
Developing of in-suit long trance profiler for testing slope error of aspherical optical Elements (EI CONFERENCE) 会议论文  OAI收割
ICO20: Optical Devices and Instruments, August 21, 2005 - August 26, 2005, Changchun, China
Zhou C.; Li H.; Chen C.; Zhou C.; Qian S.
收藏  |  浏览/下载:25/0  |  提交时间:2013/03/25
Profile error of super smooth surface of optical elements at X-ray/EUV in synchrotron radiation (SR) light beam line is described as slope error of them generally. The Long Trace Profiler (LPT) is used for testing surface slope error of SR optical elements in world generally. It is requisite to use In-suit LTP measuring surface thermal distortion of SR optical elements with high heat under high bright SR source. Authors design an In-suit LTP by means of co-path interferometer with pencil light beam. The instrument not only can be used for testing slope error of mirrors in Lab. also in situation test the distortion of mirror with high heat load at synchrotron light beam line. The device can be used to test various absolute surface figures of optical elements such as aspherieal  spherical and plane. It is needless standard reference surface. It is named by LTP-III. This paper describes its basic operating principle  optical system  mechanical constructions  DC serve motor control system  array detector  data acquisition system and computer system for controlling and data analysis of LTP-III. The Instrument has advantages of high accuracy  low cost  multifunction and wide application. Length of surface measured of optical element accuracy is 0.04 arcsec.