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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps 期刊论文  OAI收割
Frontiers of Information Technology & Electronic Engineering, 2017, 卷号: 18, 期号: 8
作者:  
Hao, J.;  L. Jing;  H. L. Ke;  Y. Wang;  Q. Gao
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Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps (Front. Inform. Technol. Electron. Eng, (2017), 18, 8, 1197-1204, 10.1631/FITEE.1500483) 期刊论文  OAI收割
2017, 卷号: 18, 期号: 10
作者:  
Hao, J.;  L. Jing;  H.-l. Ke;  Y. Wang;  Q. Gao
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Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress 期刊论文  OAI收割
Applied Optics, 2016, 卷号: 55, 期号: 27
作者:  
Wang, Y.;  L. Jing;  H. L. Ke;  J. Hao;  Q. Gao
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The Design of Two-Step-Down Aging Test for LED Lamps Under Temperature Stress 期刊论文  OAI收割
Ieee Transactions on Electron Devices, 2016, 卷号: 63, 期号: 3
作者:  
Hao, J.;  Q. Sun;  Z. J. Xu;  L. Jing;  Y. Wang and H. L. Ke
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Estimation of the average junction temperature of two phosphors-converted white LED array based on (B plus Y plus R)/B ratio 期刊论文  OAI收割
Solid-State Electronics, 2016, 卷号: 121
作者:  
Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wanga
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New method of online testing and data processing for LED lamps 期刊论文  OAI收割
Journal of Southeast University (English Edition), 2016, 卷号: 32, 期号: 4
作者:  
Hao, J.;  L. Jing;  H. Ke;  Y. Wang;  Q. Gao
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Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test 期刊论文  OAI收割
Applied Optics, 2016, 卷号: 55, 期号: 22
作者:  
Ke, H. L.;  L. Jing;  J. Hao;  Q. Gao;  Y. Wang
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Comparison of online and offline tests in LED accelerated reliability tests under temperature stress 期刊论文  OAI收割
Applied Optics, 2015, 卷号: 54, 期号: 33, 页码: 9906-9910
作者:  
Ke, H. L.;  L. Jing;  Q. Gao;  Y. Wang;  J. Hao
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