中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Characterization of defects and whole wafer uniformity of annealed undoped semi-insulating InP wafers 会议论文  OAI收割
9th international conference on defects: recognition, imaging and physics in semiconductors (drip ix), rimini, italy, sep 24-28, 2001
Zhao YW; Sun NF; Dong HW; Jiao JH; Zhao JQ; Sun TN; Lin LY
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Residual donors in undoped LEC InP 会议论文  OAI收割
11th international semiconducting and insulating materials conference (simc-xi), canberra, australia, jul 03-07, 2000
Zhao YW; Sun NF; Sun TN; Lin LY; Wu XW; Guo WL; Wu X; Bi KY
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