中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
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Progress of Lattice Design and Physics Studies on the High Energy Photon Source 会议论文  OAI收割
Brazil, 2021
作者:  
Y. Jiao;  Y. Bai;  X. Cui;  C.C. Du;  Z. Duan
  |  收藏  |  浏览/下载:24/0  |  提交时间:2022/01/18
Proposal of the Southern Advanced Photon Source and Current Physics Design Study 会议论文  OAI收割
Brazil, 2021
作者:  
S. Wang;  J. Chen;  L. Huang;  Y. Jiao;  B. Li
  |  收藏  |  浏览/下载:8/0  |  提交时间:2022/01/18
The Stability Evaluation of the Underground Cavern Group under the High-Rise Building 会议论文  OAI收割
Dalian Univ Technol, OCT 20-22, 2009
作者:  
Wu, H. Z.;  Jiao, Y. Y.;  Li, H. B.;  Zhang, X. L.;  Chen, J. F.
  |  收藏  |  浏览/下载:12/0  |  提交时间:2018/06/05
Ultraviolet electroluminescence of ZnO based heterojunction light emitting diode 会议论文  OAI收割
2006
Jiao S. J.; Lu Y. M.; Shen D. Z.; Zhang Z. Z.; Li B. H.; Zhang J. Y.; Yao B.; Liu Y. C.; Fan X. W.
收藏  |  浏览/下载:3/0  |  提交时间:2013/03/28
Ultraviolet electroluminescence of ZnO based heterojunction light emitting diode (EI CONFERENCE) 会议论文  OAI收割
12th International Conference on II-VI Compounds, September 12, 2005 - September 16, 2005, Warsaw, Poland
Jiao S. J.; Lu Y. M.; Shen D. Z.; Zhang Z. Z.; Li B. H.; Zhang J. Y.; Yao B.; Liu Y. C.; Fan X. W.
收藏  |  浏览/下载:16/0  |  提交时间:2013/03/25
ZnO/GaN p-i-n heterojunctions light emitting diodes were fabricated by plasma-assisted molecular beam epitaxy. We make use of high resistivity of nitrogen doped ZnO to fabricate n-ZnO/i-ZnO/p-GaN heterojunction light emitting diode. The emission of i-ZnO was obtained due to the limitation effect of i-ZnO on electrons and holes. Moreover  n-ZnO/i-MgO/p-GaN heterojunction light emitting diode was also fabricated. The limitation effect on electrons is increased in this heterojunction. The bright ultraviolet electroluminescence at 382 nm originating from the ZnO layer was observed in the room temperature electroluminescence spectrum. We hope to realize the stimulated emission of ZnO using these heterojunctions by the improvement of crystal quality and the optimization of device structure. 2006 WILEY-VCH Verlag GmbH Co. KGaA.