机构

• 长春光学精密机械与物... [2]

采集方式

• OAI收割 [2]

内容类型

• 会议论文 [2]

发表日期

• 2009 [2]

学科主题

筛选

浏览/检索结果: 共2条，第1-2条 帮助 限定条件 内容类型：会议论文    发表日期：2009     条数/页： 5101520253035404550556065707580859095100 排序方式： 请选择题名升序题名降序提交时间升序提交时间降序作者升序作者降序发表日期升序发表日期降序 Graph fitting test method for the interpolation error of Moire fringe (EI CONFERENCE) 会议论文  OAI收割 9th International Conference on Electronic Measurement and Instruments, ICEMI 2009, August 16, 2009 - August 19, 2009, Beijing, China 作者:  Sun Y.;  Sun Y. 收藏  |  浏览/下载：22/0  |  提交时间：2013/03/25 In order to realize the fast test for the interpolation error  the graph fitting test method for the interpolation error of Moire fringe is put forward in this paper. Firstly  the triangular wave Moire fringe photoelectric signal of the encoder whose phase difference is 90 are sampled to get the Lissajous graph of the two signals. Secondly  the single wave represented by the founded subsection function is used to fit the practical Moire fringe Lissajous graph. Then  the fitting result is tested to verify whether it satisfies the accuracy requirement. Lastly  the founded subsection function instead of the practical wave function is used to calculate the interpolation error. Using the graph fitting method to sample the Moire fringe single of 15-bits photoelectric encoder to get the interpolation error curve  the tested maximum interpolation error is 70" and the minimum error is - 69". Comparing with the interpolation error which is received from traditional test method  the change trend of the interpolation error curve is similar  and peak-peak value is almost equality. The results of experiment indicate that: the equipment is convenient and the examination method is efficient and feasible. The measure speed is fast and the manifestation result is intuitionistic. The system can be used in the working field. The method can avoid the speed influence and realize the dynamic interpolation error measure  which is significant for the research of encoder's dynamic accuracy characteristics. 2009 IEEE.   Micro assembled fourier transform spectrometer (EI CONFERENCE) 会议论文  OAI收割 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008, Chengdu, China 作者:  Liang J.-Q.;  Zhang J.;  Zhang J.;  Zhang J.;  Wang B. 收藏  |  浏览/下载：18/0  |  提交时间：2013/03/25 With the trend of minimization of Fourier transform spectrometer (FTS) which is particularly pronounced in many applications  a model of a micro FTS with no moving parts is proposed and analyzed. During analyzng  the gradients which mainly introduce phase error are accounted. Based on these assumptions and the improved Mertz phase correcting method  the spectrum of signal is simulated with real extended light source. The resolution can be up to 3.43nm@800nm  with high signal-to-noise ratio (SNR) limiting resolving ability 6.8dB. In addition  the fabrication method of components are illuminated and demonstrated  which can not only make it bear some advantages over conventional micro dispersive spectrometers  but also afford some new concepts on the design of spectrometers with improved performance. 2009 SPIE.