Electric field induced fabrication of nano dots, lines and pits with AFM
文献类型：会议论文
| 作者 | Li DH(李登辉) ; Liu ZL(刘增磊); Zhang, Ying; Jiao ND(焦念东); Liu LQ(刘连庆)
|
| 出版日期 | 2015 |
| 会议名称 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) |
| 会议日期 | June 8-12, 2015 |
| 会议地点 | Shenyang, China |
| 关键词 | Nanomanipulation nanodeposition atomic force microscope electric field field emission |
| 页码 | 1143-1148 |
| 中文摘要 | This paper researched the electric field induced fabrication with atomic force microscope (AFM). Current-induced deposition rather than voltage-induced deposition is introduced. With this method, nano dots, lines and pits can be fabricated. Especially, the nano lines can be deposited continuously, rather than depositing a row of nano dots to form a nano line. This method is expected to be used as a nano welding technique, which can improve the physical and electrical connections between the various components of nano devices. |
| 收录类别 | EI ; CPCI（ISTP） |
| 产权排序 | 1 |
| 会议录 | 2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER)
 |
| 会议录出版者 | IEEE |
| 会议录出版地 | Piscataway, NJ, USA |
| 语种 | 英语 |
| ISSN号 | 2379-7711 |
| ISBN号 | 978-1-4799-8730-6 |
| WOS记录号 | WOS:000380502300212 |
| 源URL | [http://ir.sia.cn/handle/173321/18512]  |
| 专题 | 沈阳自动化研究所_机器人学研究室 |
| 推荐引用方式 GB/T 7714 | Li DH,Liu ZL,Zhang, Ying,et al. Electric field induced fabrication of nano dots, lines and pits with AFM[C]. 见:2015 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER). Shenyang, China. June 8-12, 2015. |
入库方式： OAI收割
来源：沈阳自动化研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。